An analysis of the image homogeneity in an ionization-type infrared image converter using the fractal dimension
- Author
- YUCEL KURT, H1 ; KURT, E1 ; SALAMOV, B. G1
[1] Physics Department, Faculty of Arts and Sciences, Gazi University, Ankara, Turkey - Source
Imaging science journal. 2001, Vol 49, Num 4, pp 205-212 ; ref : 20 ref
- Publisher
- Professional Engineering Publishing, Suffolk
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse image Analyse surface Composé binaire Convertisseur image Dimension fractale Etude expérimentale Gallium arséniure Imagerie IR Photodétecteur Semiconducteur As Ga GaAs
- Keyword (en)
- Image analysis Surface analysis Binary compounds Image converters Fractal dimension Experimental study Gallium arsenides Infrared imaging Photodetectors Semiconductor materials
- Keyword (es)
- Dimensión fractal
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30V Image forming and processing
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B79 Optical elements, devices, and systems / 001B40B79L Scanners, image intensifiers, and image converters
- Discipline
- Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 13433657
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1080/13682199.2001.11784384 
https://dx.doi.org/10.1080/13682199.2001.11784384
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