Niobium and niobium nitride SQUIDs based on anodized nanobridges made with an atomic force microscope
- Author
- FAUCHER, M1 2 ; FOURNIER, T1 ; PANNETIER, B1 ; THIRION, C3 ; WERNSDORFER, W3 ; VILLEGIER, J. C4 ; BOUCHIAT, V1
[1] Centre de Recherches sur les très basses températures, UPR CNRS 5001, BP 166, 38042 Grenoble, France
[2] GPEC, UMR CNRS 6631, Université de la Méditerranée, Case 901, 13288 Marseille, France
[3] Laboratoire Louis Néel, UPR CNRS 5051, BP 166, 38042 Grenoble, France
[4] DRFMC, CEA-Grenoble, 17 rue des Martyrs, 38054 Grenoble, France - Conference title
- Proceedings of the conference on physics and applications of superconducting quantum interference: SQUID 2001, Stenungsbaden, Sweden, August 31-September 3, 2001
- Conference name
- SQUID 2001: Conference on Physics and Applications of Superconducting Quantum Interference (Stenungsbaden 2001-08-31)
- Author (monograph)
- WINKLER, Dag (Editor)1 ; IVANOV, Zdravko (Editor)2
[1] IMEGO AB, Göteborg, Sweden
[2] Chalmers University of Technology and Göteborg University, Göteborg, Sweden - Source
Physica. C. Superconductivity and its applications. 2002, Vol 368, Num 1-4, pp 211-217 ; ref : 33 ref
- Scientific domain
- Crystallography; Condensed state physics
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Anodisation Caractéristique électrique Champ magnétique Couche ultramince Dispositif SQUID Dépendance température Epaisseur couche Fabrication microélectronique Forme onde Jonction Josephson Lithographie Microscopie force atomique Méthode analyse Méthode mesure Nanostructure Niobium nitrure Niobium Résultat expérimental
- Keyword (en)
- Anodizing Electrical characteristic Magnetic field Ultrathin films SQUID devices Temperature dependence Layer thickness Microelectronic fabrication Waveform Josephson junction Lithography Atomic force microscopy Analysis method Measurement method Nanostructure Niobium nitride Niobium Experimental result
- Keyword (es)
- Anodización Característica eléctrica Campo magnético Espesor capa Fabricación microeléctrica Forma onda Unión Josephson Litografía Microscopía fuerza atómica Método análisis Método medida Nanoestructura Niobio nitruro Niobio Resultado experimental
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F11 Superconducting devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 13503038
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0921-4534(01)01168-6 
https://dx.doi.org/10.1016/S0921-4534(01)01168-6
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