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Laser irradiation effects on the resistance of SmS films

Author
DE TOMASI, Ferdinando1 ; PERRONE, Maria Rita1 ; PROTOPAPA, Maria Lucia1 ; LEO, Gabriella2
[1] Dipartimento di Fisica, Istituto Nazionale di Fisica della Materia, INFM, Universita'di Lecce, 73100 Lecce, Italy
[2] Istituto per lo studio di nuovi Material per l'Elettronica (IME) - CNR, Via Arnesano, 73100 Lecce, Italy
Source

Thin solid films. 2002, Vol 413, Num 1-2, pp 171-176 ; ref : 20 ref

CODEN
THSFAP
ISSN
0040-6090
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Elsevier Science, Lausanne
Publication country
Switzerland
Document type
Article
Language
English
Keyword (fr)
Conductivité électrique Couche mince Effet rayonnement Etude expérimentale Fluence Microscopie électronique balayage Modulation Rayonnement laser Samarium sulfure Semiconducteur Traitement par laser S Sm SmS Lanthanide composé
Keyword (en)
Electrical conductivity Thin films Radiation effects Experimental study Fluence Scanning electron microscopy Modulation Laser radiation Samarium sulfides Semiconductor materials Laser assisted processing Rare earth compounds
Keyword (es)
Fluencia
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C50 Electronic transport phenomena in thin films and low-dimensional structures / 001B70C50D Low-field transport and mobility; piezoresistance

Pacs
7350D Low-field transport and mobility; piezoresistance

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
13806599

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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