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Sub-ångstrom resolution using aberration corrected electron optics

Author
BATSON, P. E1 ; DELLBY, N2 ; KRIVANEK, O. L2
[1] IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598, United States
[2] Nion R&D, Kirkland, Washington 98033, United States
Source

Nature (London). 2002, Vol 418, Num 6898, pp 617-620 ; ref : 20 ref

CODEN
NATUAS
ISSN
0028-0836
Scientific domain
Multidisciplinary
Publisher
Nature Publishing, London
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Agrégat atomique Alliage binaire Germanium alliage Microscopie électronique balayage transmission Microscopie électronique transmission Microscopie électronique Or Atome Or Silicium alliage Au Ge Si Ge30Si70 Résolution atomique
Keyword (en)
Atomic clusters Binary alloys Germanium alloys Scanning transmission electron microscopy Transmission electron microscopy Electron microscopy Gold Atoms Gold Silicon alloys Atomic resolution
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques

Pacs
0778 Electron, positron, and ion microscopes, electron diffractometers, and related techniques

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
13822598

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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