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Oxygen isotopic measurements on the Cameca Nanosims 50

Author
SLODZIAN, G1 ; HILLION, F2 ; STADERMANN, F. J3 ; HORREARD, F2
[1] Inboratoire de Physique des Solides, Bât 510, University of Paris, Sud, 91405 Orsay, France
[2] Cameca, 103 Boulevard Saint Denis, 92400 Courbevoie, France
[3] Department of Physics, Mc Donell Center for Space Sciences, Washington University, 1 Brookings Drive, St Louis, MO 63130, United States
Conference title
Secondary Ion Mass Spectrometry SIMS XIII: Proceedings of the Thirteenth International Conference on Secondary Ion Mass Spectrometry and Related Topics Nara-Ken New Public Hall, Nara, Japan, November 11-16, 2001
Conference name
SIMS XIII: Secondary Ion Mass Spectrometry and Related Topics. International Conference (13 ; Nara 2001-11-11)
Author (monograph)
BENNINGHOVEN, A (Editor)1 ; NIHEI, Y (Editor)2 ; KUDO, M (Editor); HOMMA, Y (Editor); YURIMOTO, H (Editor); WERNER, H. W (Editor)
[1] Physikalisches Institut, University Muster, Wilhelm-Klemm-Strasse 10, Munster 48149, Germany
[2] Faculty of Science and Technology, Tokyo University of Science, 2641 Yamazaki Noda-shi, Chiba 278-8510, Japan
Source

Applied surface science. 2003, Vol 203-04, pp 798-801, 4 p ; ref : 5 ref

ISSN
0169-4332
Scientific domain
General chemistry, physical chemistry; Crystallography; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Elsevier Science, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Author keyword
Electron multiplier Isotopes Oxygen SIMS Silicon
Keyword (fr)
Abondance relative isotope Détecteur multiplicateur électron Oxygène 16 Oxygène 17 Oxygène 18 SIMS Spectromètre masse
Keyword (en)
Isotope relative abundance Electron multiplier detectors Oxygen 16 Oxygen 17 Oxygen 18 SIMS Mass spectrometers
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G75 Mass spectrometers and related techniques

Pascal
001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics / 001B30B Atomic properties and interactions with photons / 001B30B10 Properties of atoms and atomic ions / 001B30B10B Atomic masses, mass spectra, abundances and isotopes

Pacs
0775 Mass spectrometers and related techniques

Pacs
3210B Atomic masses, mass spectra, abundances, and isotopes

Discipline
Atomic and molecular physics Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
14441628

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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