Metal-insulator transition in two-dimensional systems with long-range correlated disorder
- Author
- LIU, Wen-Sheng1 2 ; LIU, S. Y1 ; LEI, X. L1
[1] Department of Physics, Shanghai Jiaotong University, 1954 Huashan Road, Shanghai 200030, China
[2] Department of Basic Science, Zhongyuan Institute and Technology, Zhengzhou 450007, China - Source
The European physical journal. B, Condensed matter physics. 2003, Vol 33, Num 3, pp 293-296, 4 p ; ref : 17 ref
- ISSN
- 1434-6028
- Scientific domain
- Condensed state physics; Theoretical physics
- Publisher
- EDP sciences, Les Ulis
/
Springer, Berlin
- Publication country
- France
- Document type
- Article
- Language
- English
- Keyword (fr)
- Approximation liaison forte Corrélation électronique Désordre Effet taille finie Etude théorique Localisation électronique Modèle Anderson Méthode matrice transfert Méthode numérique Réseau carré Système 2 dimensions Transition métal isolant
- Keyword (en)
- Tight binding approximation Electron correlations Disorder Finite size effect Theoretical study Electron localization Anderson model Transfer matrix method Numerical method Square lattices Two-dimensional systems Metal-insulator transition
- Keyword (es)
- Desorden Efecto dimensión finita Localización electrónica Método numérico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70A Electron states / 001B70A30 Metal-insulator transitions and other electronic transitions
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C20 Surface and interface electron states / 001B70C20F Localization effects (anderson or weak localization)
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 14907510
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1140/epjb/e2003-00169-4 
https://dx.doi.org/10.1140/epjb/e2003-00169-4
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