Electron beam-induced current, cathodoluminescence and cross-sectional transmission electron microscopy characterization of degraded AlGaAs/GaAs lasers
- Author
- RATAJCZAK, J1 ; KATCKI, J1 ; MALAG, A2
[1] Institute of Electron Technology, Al. Lotników 32/46, 06-668 Warsaw, Poland
[2] Institute of Electronic Materials Technology, ul. Wólczyńska 133, 01-919 Warsaw, Poland - Conference title
- EMC 2002: XIth International Conference on Electron Microscopy of Solids, May 19-23, 2002 in Krynica, Poland
- Conference name
- EMC 2002 International Conference on Electron Microscopy of Solids (11 ; Krynica 2002-05-19)
- Author (monograph)
- BIELANSKA, Elzbieta (Editor)1 ; DUTKIEWICZ, Jan (Editor)1 ; ZIEBA, Pawel (Editor)1
Polish Materials Society ; State Committee for Scientific Research, Poland (Funder/Sponsor)
Polish Academy of Sciences ; Committee on Materials Science ; Microscopy Section, Poland (Funder/Sponsor)
[1] Polish Academy of Sciences, Institute of Metallurgy and Materials Science, Cracow, Poland - Source
Materials chemistry and physics. 2003, Vol 81, Num 2-3, pp 269-272, 4 p ; ref : 5 ref
- CODEN
- MCHPDR
- ISSN
- 0254-0584
- Scientific domain
- Chemistry; Metallurgy, welding; Physics
- Publisher
- Elsevier, Lausanne
- Publication country
- Switzerland
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Caractérisation Cathodoluminescence Courant induit Faisceau électronique Laser Microscopie électronique transmission Microscopie électronique
- Keyword (en)
- Characterization Cathodoluminescence Induced current Electron beam Lasers Transmission electron microscopy Electron microscopy
- Keyword (es)
- Caracterización Corriente inducida Haz electrónico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 15085338
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0254-0584(02)00599-0 
https://dx.doi.org/10.1016/S0254-0584(02)00599-0
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