Spatial pattern discovery by learning a probabilistic parametric model from multiple attributed relational graphs
- Author
- PENGYU HONG1 ; HUANG, Thomas S2
[1] Science Center 601, Harvard University, 1 Oxford Street, Cambridge, MA 02138, United States
[2] Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL 61801, United States - Conference title
- The 2001 International Workshop on Combinatorial Image Analysis (IWCIA 2001)
- Conference name
- IWCIA 2001: International Workshop on Combinatorial Image Analysis (Philadelphia, Pennsylvania 2001-08-23)
- Author (monograph)
- FOUREY, Sébastien (Editor)1 ; HERMAN, Gabor T (Editor)2 ; KONG, T. Yung (Editor)3 ; ROSENFELD, Azriel (Editor)4
[1] GREYC Image, ISMRA, 6 bd Maréchal Juin, 14050 Caen, France
[2] Ph.D. Program in Computer Science, Graduate School and University Center, CUNY, 365 5th Ave, New York, NY 10016, United States
[3] Computer Science Department, Queens College, CUNY, 65-30 Kissena Blvd., Flushing, NY 11367, United States
[4] Center for Automation Research, University of Maryland, College Park, MD 20742, United States - Source
Discrete applied mathematics. 2004, Vol 139, Num 1-3, pp 113-135, 23 p ; ref : 21 ref
- CODEN
- DAMADU
- ISSN
- 0166-218X
- Scientific domain
- Control theory, operational research; Computer science; Mathematics
- Publisher
- Elsevier, Amsterdam
/
Elsevier, Lausanne
/
Elsevier, New York, NY
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Algorithme EM Apprentissage Conception Extraction forme Informatique théorique Maximisation Maximum vraisemblance Modèle probabiliste Méthode statistique Optimisation Reconnaissance forme 05Bxx 68R10 Algorithme combinatoire
- Keyword (en)
- EM algorithm Learning Design Pattern extraction Computer theory Maximization Maximum likelihood Probabilistic model Statistical method Optimization Pattern recognition
- Keyword (es)
- Algoritmo EM Aprendizaje Diseño Extracción forma Informática teórica Maximización Maxima verosimilitud Modelo probabilista Método estadístico Optimización Reconocimiento patrón
- Classification
- Pascal
- 001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics / 001A02B Combinatorics. Ordered structures / 001A02B01 Combinatorics / 001A02B01C Graph theory
- Pascal
- 001 Exact sciences and technology / 001A Sciences and techniques of general use / 001A02 Mathematics / 001A02H Probability and statistics / 001A02H02 Statistics / 001A02H02B Mathematical foundations
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02A Theoretical computing / 001D02A05 Algorithmics. Computability. Computer arithmetics
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02C Artificial intelligence / 001D02C03 Pattern recognition. Digital image processing. Computational geometry
- Discipline
- Computer science : theoretical automation and systems Mathematics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 15694308
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.dam.2002.11.007 
https://dx.doi.org/10.1016/j.dam.2002.11.007
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