Ultraprecise atomic mass measurement of the α particle and 4He
- Author
- VAN DYCK, R. S1 ; ZAFONTE, S. L1 ; VAN LIEW, S1 ; PINEGAR, D. B1 ; SCHWINBERG, P. B1
[1] Department of Physics, University of Washington, Seattle, Washington 98195-1560, United States - Source
Physical review letters. 2004, Vol 92, Num 22, pp 220802.1-220802.4 ; ref : 27 ref
- CODEN
- PRLTAO
- ISSN
- 0031-9007
- Scientific domain
- Optics; Atomic molecular physics; Condensed state physics; Physics; Plasma physics
- Publisher
- American Physical Society, Ridge, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Hélium 4 Masse atomique Particule alpha Résonance cyclotronique ionique
- Keyword (en)
- Helium 4 Atomic weight Alpha particles Ion cyclotron resonance
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00F Metrology, measurements and laboratory procedures / 001B00F20 Metrology / 001B00F20J Determination of fundamental constants
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics / 001B30B Atomic properties and interactions with photons / 001B30B10 Properties of atoms and atomic ions / 001B30B10B Atomic masses, mass spectra, abundances and isotopes
- Discipline
- Atomic and molecular physics Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 15886159
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1103/PhysRevLett.92.220802 
https://dx.doi.org/10.1103/PhysRevLett.92.220802
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