An experimental study of carrier heating on channel noise in deep-submicrometer NMOSFETs via body bias
- Author
- HONG WANG1 ; RONG ZENG1 ; XIUPING LI2
[1] Microelectronic Centre, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore
[2] School of Telecommunication Engineering, Beijing University of Posts and Telecommunications, Beijing 100876, China - Conference name
- Radio Frequency Integrated Circuits (RFIC) Symposium (RFIC) Symposium (Fort Worth, TX 2004-06-06)
- Source
IEEE transactions on microwave theory and techniques. 2005, Vol 53, Num 2, pp 564-570, 7 p ; ref : 23 ref
- CODEN
- IETMAB
- ISSN
- 0018-9480
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Hot carriers MOSFETs semiconductor device noise
- Keyword (fr)
- Etude expérimentale Porteur chaud Réduction bruit Submicromètre Transistor MOSFET
- Keyword (en)
- Experimental study Hot carrier Noise reduction Submicrometer MOSFET
- Keyword (es)
- Estudio experimental Portador caliente Reducción ruido Submicrómetro
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 16518082
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TMTT.2004.840647 
https://dx.doi.org/10.1109/TMTT.2004.840647
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