Annealing properties of ZnO films grown using diethyl zinc and tertiary butanol
- Author
- WANG, J. Z1 ; PERES, M1 ; SOARES, J1 ; GOROCHOV, O2 ; BARRADAS, N. P3 ; ALVES, E3 ; LEWIS, J. E4 ; FORTUNATO, E5 ; NEVES, A1 ; MONTEIRO, T1
[1] Department of Physics, Aveiro University, 3810-193 Aveiro, Portugal
[2] LPSC-CNRS, 1 Place Aristide Briand, 92195 Meudon, France
[3] Instituto Tecnológico e Nuclear, EN 10, 2685-953 Sacavém, Portugal
[4] Physics Department, Plattsburgh State University of New York, 101, Broad Street, Plattsburgh, NY 12901, United States
[5] Department of Materials Science/CENIMAT, Faculty of Sciences and Technology, New University of Lisbon, 2829-516 Caparica, Portugal - Source
Journal of physics. Condensed matter (Print). 2005, Vol 17, Num 10, pp 1719-1724, 6 p ; ref : 12 ref
- CODEN
- JCOMEL
- ISSN
- 0953-8984
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Institute of Physics, Bristol
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé minéral Couche mince Diffraction RX Diffusion Rutherford Mode vibration Métal transition composé Métal transition Méthode ERDA Méthode MOCVD Photoluminescence RBS Recuit Semiconducteur Spectre Raman Zinc oxyde 6322 6855J 7866L O Zn ZnO
- Keyword (en)
- Inorganic compounds Thin films XRD Rutherford scattering Vibrational modes Transition element compounds Transition elements Elastic recoil detection analysis method MOCVD Photoluminescence RBS Annealing Semiconductor materials Raman spectra Zinc oxides
- Keyword (es)
- Método ERDA
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60C Lattice dynamics / 001B60C22 Phonons in low-dimensional structures and small particles
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films / 001B70H66L Other semiconductors
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 16583461
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1088/0953-8984/17/10/026 
https://dx.doi.org/10.1088/0953-8984/17/10/026
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