Density functional theory description of hole-trapping in SiO2 : A self-interaction-corrected approach
- Author
- D'AVEZAC, Mayeul1 ; CALANDRA, Matteo1 ; MAURI, Francesco1
[1] Laboratoire de Minéralogie-Cristallographie, case 115, 4 place Jussieu, 75252, Paris, France - Source
Physical review B. Condensed matter and materials physics. 2005, Vol 71, Num 20, pp 205210.1-205210.5 ; ref : 25 ref
- ISSN
- 1098-0121
- Scientific domain
- Metallurgy, welding; Condensed state physics
- Publisher
- American Physical Society, Ridge, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Autocohérence Autopiégeage Implémentation Interaction hyperfine Minimisation Méthode fonctionnelle densité Piégeage porteur charge Silicium oxyde 7220J O Si SiO2
- Keyword (en)
- Self consistency Self trapping Implementation Hyperfine interactions Minimization Density functional method Charge carrier trapping Silicon oxides
- Keyword (es)
- Autocoherencia Autocaptura Captura portador carga
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70B Electronic transport in condensed matter / 001B70B20 Conductivity phenomena in semiconductors and insulators / 001B70B20J Charge carriers: generation, recombination, lifetime, and trapping
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 16904947
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Install on your browser
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:102:\"Density functional theory description of hole-trapping in SiO2 : A self-interaction-corrected approach\";s:9:\"\u0000*\u0000jtitle\";s:57:\"Physical review B. Condensed matter and materials physics\";s:9:\"\u0000*\u0000stitle\";s:42:\"Phys. rev., B, condens. matter mater. phys\";s:7:\"\u0000*\u0000date\";s:4:\"2005\";s:9:\"\u0000*\u0000volume\";s:2:\"71\";s:8:\"\u0000*\u0000issue\";s:2:\"20\";s:8:\"\u0000*\u0000spage\";s:8:\"205210.1\";s:8:\"\u0000*\u0000epage\";s:8:\"205210.5\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1098-0121\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:8:\"D'AVEZAC\";s:10:\"\u0000*\u0000aufirst\";s:6:\"Mayeul\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:2:{i:0;s:16:\"CALANDRA, Matteo\";i:1;s:16:\"MAURI, Francesco\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:102:\"Density functional theory description of hole-trapping in SiO2 : A self-interaction-corrected approach\";s:8:\"\u0000*\u0000place\";s:9:\"Ridge, NY\";s:6:\"\u0000*\u0000pub\";s:25:\"American Physical Society\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:102:\"Density functional theory description of hole-trapping in SiO2 : A self-interaction-corrected approach\";s:9:\"\u0000*\u0000jtitle\";s:57:\"Physical review B. Condensed matter and materials physics\";s:9:\"\u0000*\u0000stitle\";s:42:\"Phys. rev., B, condens. matter mater. phys\";s:7:\"\u0000*\u0000date\";s:4:\"2005\";s:9:\"\u0000*\u0000volume\";s:2:\"71\";s:8:\"\u0000*\u0000issue\";s:2:\"20\";s:8:\"\u0000*\u0000spage\";s:8:\"205210.1\";s:8:\"\u0000*\u0000epage\";s:8:\"205210.5\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1098-0121\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:8:\"D'AVEZAC\";s:10:\"\u0000*\u0000aufirst\";s:6:\"Mayeul\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:2:{i:0;s:16:\"CALANDRA, Matteo\";i:1;s:16:\"MAURI, Francesco\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:102:\"Density functional theory description of hole-trapping in SiO2 : A self-interaction-corrected approach\";s:8:\"\u0000*\u0000place\";s:9:\"Ridge, NY\";s:6:\"\u0000*\u0000pub\";s:25:\"American Physical Society\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:102:\"Density functional theory description of hole-trapping in SiO2 : A self-interaction-corrected approach\";s:9:\"\u0000*\u0000jtitle\";s:57:\"Physical review B. Condensed matter and materials physics\";s:9:\"\u0000*\u0000stitle\";s:42:\"Phys. rev., B, condens. matter mater. phys\";s:7:\"\u0000*\u0000date\";s:4:\"2005\";s:9:\"\u0000*\u0000volume\";s:2:\"71\";s:8:\"\u0000*\u0000issue\";s:2:\"20\";s:8:\"\u0000*\u0000spage\";s:8:\"205210.1\";s:8:\"\u0000*\u0000epage\";s:8:\"205210.5\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1098-0121\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:8:\"D'AVEZAC\";s:10:\"\u0000*\u0000aufirst\";s:6:\"Mayeul\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:2:{i:0;s:16:\"CALANDRA, Matteo\";i:1;s:16:\"MAURI, Francesco\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:102:\"Density functional theory description of hole-trapping in SiO2 : A self-interaction-corrected approach\";s:8:\"\u0000*\u0000place\";s:9:\"Ridge, NY\";s:6:\"\u0000*\u0000pub\";s:25:\"American Physical Society\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Europe PubMed Central access
"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:102:\"Density functional theory description of hole-trapping in SiO2 : A self-interaction-corrected approach\";s:9:\"\u0000*\u0000jtitle\";s:57:\"Physical review B. Condensed matter and materials physics\";s:9:\"\u0000*\u0000stitle\";s:42:\"Phys. rev., B, condens. matter mater. phys\";s:7:\"\u0000*\u0000date\";s:4:\"2005\";s:9:\"\u0000*\u0000volume\";s:2:\"71\";s:8:\"\u0000*\u0000issue\";s:2:\"20\";s:8:\"\u0000*\u0000spage\";s:8:\"205210.1\";s:8:\"\u0000*\u0000epage\";s:8:\"205210.5\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1098-0121\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:8:\"D'AVEZAC\";s:10:\"\u0000*\u0000aufirst\";s:6:\"Mayeul\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:2:{i:0;s:16:\"CALANDRA, Matteo\";i:1;s:16:\"MAURI, Francesco\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:102:\"Density functional theory description of hole-trapping in SiO2 : A self-interaction-corrected approach\";s:8:\"\u0000*\u0000place\";s:9:\"Ridge, NY\";s:6:\"\u0000*\u0000pub\";s:25:\"American Physical Society\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Base Search access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:102:\"Density functional theory description of hole-trapping in SiO2 : A self-interaction-corrected approach\";s:9:\"\u0000*\u0000jtitle\";s:57:\"Physical review B. Condensed matter and materials physics\";s:9:\"\u0000*\u0000stitle\";s:42:\"Phys. rev., B, condens. matter mater. phys\";s:7:\"\u0000*\u0000date\";s:4:\"2005\";s:9:\"\u0000*\u0000volume\";s:2:\"71\";s:8:\"\u0000*\u0000issue\";s:2:\"20\";s:8:\"\u0000*\u0000spage\";s:8:\"205210.1\";s:8:\"\u0000*\u0000epage\";s:8:\"205210.5\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1098-0121\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:8:\"D'AVEZAC\";s:10:\"\u0000*\u0000aufirst\";s:6:\"Mayeul\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:2:{i:0;s:16:\"CALANDRA, Matteo\";i:1;s:16:\"MAURI, Francesco\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:102:\"Density functional theory description of hole-trapping in SiO2 : A self-interaction-corrected approach\";s:8:\"\u0000*\u0000place\";s:9:\"Ridge, NY\";s:6:\"\u0000*\u0000pub\";s:25:\"American Physical Society\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
arXiv access
