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Coherent x-ray diffraction from quantum dots

Author
VARTANYANTS, I. A1 2 ; ROBINSON, I. K2 ; ONKEN, J. D2 ; PFEIFER, M. A2 ; WILLIAMS, G. J2 ; PFEIFFER, F3 ; METZGER, H4 ; ZHONG, Z5 6 ; BAUER, G6
[1] HASYLAB, DESY, Notkestr. 85, Hamburg 22607, Germany
[2] Department of Physics, University of Illinois, 1110 W. Green St, Urbana, Illinois 61801, United States
[3] Swiss Light Source, Paul Scherrer Institut, 5232 Villigen, Switzerland
[4] ESRF, BP 220, 38043 Grenoble, France
[5] Max-Planck-Institut für Festkörperforschung, Heisenbergstrasse 1, 70569 Stuttgart, Germany
[6] Insitut für Hableiter-und Festköperphysik, Johannes Kepler Universität Linz, 4040 Linz, Austria
Source

Physical review B. Condensed matter and materials physics. 2005, Vol 71, Num 24, pp 245302.1-245302.9 ; ref : 42 ref

ISSN
1098-0121
Scientific domain
Metallurgy, welding; Condensed state physics
Publisher
American Physical Society, Ridge, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Alliage Ge Si Cristal parfait Diffraction RX Incidence rasante Point quantique Rayonnement cohérent Structure îlot 6865
Keyword (en)
Ge-Si alloys Perfect crystals XRD Grazing incidence Quantum dots Coherent radiation Island structure
Keyword (es)
Cristal perfecto Incidencia rasante
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H65 Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
17036760

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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