Anomalous roughness evolution of rubrene thin films observed in real time during growth
- Author
- KOWARIK, S1 2 ; GERLACH, A1 2 ; SELLNER, S2 ; SCHREIBER, F1 2 ; PFLAUM, J3 ; CAVALCANTI, L4 ; KONOVALOV, O4
[1] Physical and Theoretical Chemistry, Oxford University, South Parks Road, Oxford, OX1 3QZ, United Kingdom
[2] Institut für Angewandte Physik-Vniversität, Tübingen, Auf der Morgenstelle 10, 72076 Tübingen, Germany
[3] 3. Physikalisches Institut, Universität Stuttgart, Pfaffenwaldring 57, 70550 Stuttgart, Germany
[4] European Synchrotron Radiation Facility, 6, rue Jules Horowitz-B.P. 220, 38043, Grenoble, France - Source
PCCP. Physical chemistry chemical physics (Print). 2006, Vol 8, Num 15, pp 1834-1836, 3 p ; ref : 13 ref
- Publisher
- Royal Society of Chemistry, Cambridge
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Couche mince Croissance Diffraction Diffusion RX Dépôt Epaisseur Faisceau moléculaire Film In situ Incidence rasante Morphologie Oxyde Rugosité Semiconducteur Silicium Structure Surface lisse Temps réel Rubrène
- Keyword (en)
- Thin film Growth Diffraction X ray scattering Deposition Thickness Molecular beam Film In situ Grazing incidence Morphology Oxides Roughness Semiconductor materials Silicon Structure Smooth surface Real time
- Keyword (es)
- Capa fina Crecimiento Difracción Difusión rayo X Depósito Espesor Haz molecular Película In situ Incidencia rasante Morfología Óxido Rugosidad Semiconductor(material) Silicio Estructura Superficie lisa Tiempo real
- Classification
- Discipline
- General chemistry and physical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 17717769
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Access to the document
Install on your browser
DOI
10.1039/b517866e 
https://dx.doi.org/10.1039/b517866e
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:16:\"10.1039\/b517866e\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:87:\"Anomalous roughness evolution of rubrene thin films observed in real time during growth\";s:9:\"\u0000*\u0000jtitle\";s:49:\"PCCP. Physical chemistry chemical physics (Print)\";s:9:\"\u0000*\u0000stitle\";s:37:\"PCCP, Phys. chem. chem. phys. (Print)\";s:7:\"\u0000*\u0000date\";s:4:\"2006\";s:9:\"\u0000*\u0000volume\";s:1:\"8\";s:8:\"\u0000*\u0000issue\";s:2:\"15\";s:8:\"\u0000*\u0000spage\";s:4:\"1834\";s:8:\"\u0000*\u0000epage\";s:4:\"1836\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1463-9076\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"KOWARIK\";s:10:\"\u0000*\u0000aufirst\";s:1:\"S\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:6:{i:0;s:10:\"GERLACH, A\";i:1;s:10:\"SELLNER, S\";i:2;s:12:\"SCHREIBER, F\";i:3;s:9:\"PFLAUM, J\";i:4;s:13:\"CAVALCANTI, L\";i:5;s:12:\"KONOVALOV, O\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:87:\"Anomalous roughness evolution of rubrene thin films observed in real time during growth\";s:8:\"\u0000*\u0000place\";s:9:\"Cambridge\";s:6:\"\u0000*\u0000pub\";s:26:\"Royal Society of Chemistry\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"3\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:16:\"10.1039\/b517866e\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:87:\"Anomalous roughness evolution of rubrene thin films observed in real time during growth\";s:9:\"\u0000*\u0000jtitle\";s:49:\"PCCP. Physical chemistry chemical physics (Print)\";s:9:\"\u0000*\u0000stitle\";s:37:\"PCCP, Phys. chem. chem. phys. (Print)\";s:7:\"\u0000*\u0000date\";s:4:\"2006\";s:9:\"\u0000*\u0000volume\";s:1:\"8\";s:8:\"\u0000*\u0000issue\";s:2:\"15\";s:8:\"\u0000*\u0000spage\";s:4:\"1834\";s:8:\"\u0000*\u0000epage\";s:4:\"1836\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1463-9076\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"KOWARIK\";s:10:\"\u0000*\u0000aufirst\";s:1:\"S\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:6:{i:0;s:10:\"GERLACH, A\";i:1;s:10:\"SELLNER, S\";i:2;s:12:\"SCHREIBER, F\";i:3;s:9:\"PFLAUM, J\";i:4;s:13:\"CAVALCANTI, L\";i:5;s:12:\"KONOVALOV, O\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:87:\"Anomalous roughness evolution of rubrene thin films observed in real time during growth\";s:8:\"\u0000*\u0000place\";s:9:\"Cambridge\";s:6:\"\u0000*\u0000pub\";s:26:\"Royal Society of Chemistry\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"3\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"UnpaywallOpenUrl\":35:{s:8:\"\u0000*\u0000email\";s:27:\"assistance-portail@inist.fr\";s:6:\"\u0000*\u0000fmt\";N;s:6:\"\u0000*\u0000doi\";s:16:\"10.1039\/b517866e\";s:6:\"\u0000*\u0000pii\";N;s:7:\"\u0000*\u0000pmid\";N;s:9:\"\u0000*\u0000atitle\";N;s:9:\"\u0000*\u0000jtitle\";N;s:9:\"\u0000*\u0000stitle\";N;s:7:\"\u0000*\u0000date\";N;s:9:\"\u0000*\u0000volume\";N;s:8:\"\u0000*\u0000issue\";N;s:8:\"\u0000*\u0000spage\";N;s:8:\"\u0000*\u0000epage\";N;s:8:\"\u0000*\u0000pages\";N;s:7:\"\u0000*\u0000issn\";N;s:8:\"\u0000*\u0000eissn\";N;s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";N;s:9:\"\u0000*\u0000aucorp\";N;s:7:\"\u0000*\u0000isbn\";N;s:8:\"\u0000*\u0000coden\";N;s:8:\"\u0000*\u0000genre\";N;s:7:\"\u0000*\u0000part\";N;s:9:\"\u0000*\u0000btitle\";N;s:8:\"\u0000*\u0000title\";N;s:8:\"\u0000*\u0000place\";N;s:6:\"\u0000*\u0000pub\";N;s:10:\"\u0000*\u0000edition\";N;s:9:\"\u0000*\u0000tpages\";N;s:9:\"\u0000*\u0000series\";N;s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";N;}"
Unpaywall access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:16:\"10.1039\/b517866e\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:87:\"Anomalous roughness evolution of rubrene thin films observed in real time during growth\";s:9:\"\u0000*\u0000jtitle\";s:49:\"PCCP. Physical chemistry chemical physics (Print)\";s:9:\"\u0000*\u0000stitle\";s:37:\"PCCP, Phys. chem. chem. phys. (Print)\";s:7:\"\u0000*\u0000date\";s:4:\"2006\";s:9:\"\u0000*\u0000volume\";s:1:\"8\";s:8:\"\u0000*\u0000issue\";s:2:\"15\";s:8:\"\u0000*\u0000spage\";s:4:\"1834\";s:8:\"\u0000*\u0000epage\";s:4:\"1836\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1463-9076\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"KOWARIK\";s:10:\"\u0000*\u0000aufirst\";s:1:\"S\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:6:{i:0;s:10:\"GERLACH, A\";i:1;s:10:\"SELLNER, S\";i:2;s:12:\"SCHREIBER, F\";i:3;s:9:\"PFLAUM, J\";i:4;s:13:\"CAVALCANTI, L\";i:5;s:12:\"KONOVALOV, O\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:87:\"Anomalous roughness evolution of rubrene thin films observed in real time during growth\";s:8:\"\u0000*\u0000place\";s:9:\"Cambridge\";s:6:\"\u0000*\u0000pub\";s:26:\"Royal Society of Chemistry\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"3\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Europe PubMed Central access
"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:16:\"10.1039\/b517866e\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:87:\"Anomalous roughness evolution of rubrene thin films observed in real time during growth\";s:9:\"\u0000*\u0000jtitle\";s:49:\"PCCP. Physical chemistry chemical physics (Print)\";s:9:\"\u0000*\u0000stitle\";s:37:\"PCCP, Phys. chem. chem. phys. (Print)\";s:7:\"\u0000*\u0000date\";s:4:\"2006\";s:9:\"\u0000*\u0000volume\";s:1:\"8\";s:8:\"\u0000*\u0000issue\";s:2:\"15\";s:8:\"\u0000*\u0000spage\";s:4:\"1834\";s:8:\"\u0000*\u0000epage\";s:4:\"1836\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1463-9076\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"KOWARIK\";s:10:\"\u0000*\u0000aufirst\";s:1:\"S\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:6:{i:0;s:10:\"GERLACH, A\";i:1;s:10:\"SELLNER, S\";i:2;s:12:\"SCHREIBER, F\";i:3;s:9:\"PFLAUM, J\";i:4;s:13:\"CAVALCANTI, L\";i:5;s:12:\"KONOVALOV, O\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:87:\"Anomalous roughness evolution of rubrene thin films observed in real time during growth\";s:8:\"\u0000*\u0000place\";s:9:\"Cambridge\";s:6:\"\u0000*\u0000pub\";s:26:\"Royal Society of Chemistry\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"3\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Base Search access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:16:\"10.1039\/b517866e\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:87:\"Anomalous roughness evolution of rubrene thin films observed in real time during growth\";s:9:\"\u0000*\u0000jtitle\";s:49:\"PCCP. Physical chemistry chemical physics (Print)\";s:9:\"\u0000*\u0000stitle\";s:37:\"PCCP, Phys. chem. chem. phys. (Print)\";s:7:\"\u0000*\u0000date\";s:4:\"2006\";s:9:\"\u0000*\u0000volume\";s:1:\"8\";s:8:\"\u0000*\u0000issue\";s:2:\"15\";s:8:\"\u0000*\u0000spage\";s:4:\"1834\";s:8:\"\u0000*\u0000epage\";s:4:\"1836\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"1463-9076\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"KOWARIK\";s:10:\"\u0000*\u0000aufirst\";s:1:\"S\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:6:{i:0;s:10:\"GERLACH, A\";i:1;s:10:\"SELLNER, S\";i:2;s:12:\"SCHREIBER, F\";i:3;s:9:\"PFLAUM, J\";i:4;s:13:\"CAVALCANTI, L\";i:5;s:12:\"KONOVALOV, O\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:87:\"Anomalous roughness evolution of rubrene thin films observed in real time during growth\";s:8:\"\u0000*\u0000place\";s:9:\"Cambridge\";s:6:\"\u0000*\u0000pub\";s:26:\"Royal Society of Chemistry\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"3\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
arXiv access
