Redundancy and testability in digital filter datapaths
- Author
- GOODBY, L1 ; ORAILOGLU, A2
[1] Hewlett-Packard Company, Palo Alto, CA 94304, United States
[2] Department of Computer Science and Engineering, University of California at San Diego, La Jolla, CA 92093-0114, United States - Source
IEEE transactions on computer-aided design of integrated circuits and systems. 1999, Vol 18, Num 5, pp 631-644 ; ref : 24 ref
- CODEN
- ITCSDI
- ISSN
- 0278-0070
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse circuit Autotest Circuit VLSI Conception assistée Détection défaut Filtre numérique Filtre réponse impulsion finie Implémentation Redondance Résultat expérimental Simulation Traitement numérique Traitement signal
- Keyword (en)
- Network analysis Built in self test VLSI circuit Computer aided design Defect detection Digital filter Finite impulse response filter Implementation Redundancy Experimental result Simulation Digital processing Signal processing
- Keyword (es)
- Análisis circuito Autoprueba Circuito VLSI Concepción asistida Detección imperfección Filtro numérico Filtro respuesta impulsión acabada Ejecución Redundancia Resultado experimental Simulación Tratamiento numérico Procesamiento señal
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B11 Computer aided design
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)
- Discipline
- Computer science : theoretical automation and systems Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1776804
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/43.759079 
https://dx.doi.org/10.1109/43.759079
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