Modeling the responses of thickness-shear mode resonators under various loading conditions
- Author
- BANDEY, H. L1 ; MARTIN, S. J1 ; CERNOSEK, R. W1 ; HILLMAN, A. R2
[1] Microsensor Research and Development Department, Sandia National Laboratories, Albuquerque, New Mexico 87185-1425, United States
[2] Chemistry Department, Leicester University, Leicester, LE1 7RH, United Kingdom - Source
Analytical chemistry (Washington, DC). 1999, Vol 71, Num 11, pp 2205-2214 ; ref : 28 ref
- CODEN
- ANCHAM
- ISSN
- 0003-2700
- Scientific domain
- Analytical chemistry
- Publisher
- American Chemical Society, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Capteur chimique Détecteur piézoélectrique Etude théorique Impédance mécanique Impédance surface Impédance électrique Modèle mathématique Propriété physique Résonateur quartz
- Keyword (en)
- Chemical sensor Piezoelectric detector Theoretical study Mechanical impedance Surface impedance Electrical impedance Mathematical model Physical properties Quartz resonator
- Keyword (es)
- Captador químico Detector piezoeléctrico Estudio teórico Impedancia mecánica Impedancia superficie Impedancia eléctrica Modelo matemático Propiedad física Resonador cuarzo
- Classification
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04A General, instrumentation
- Discipline
- Analytical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1803307
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1021/ac981272b 
https://dx.doi.org/10.1021/ac981272b
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