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Morphology identification of the thin film phases of vacuum evaporated pentacene on SiO2 substrates

Author
BOUCHOMS, I. P. M1 ; SCHOONVELD, W. A1 ; VRIJMOETH, J1 ; KLAPWIJK, T. M1
[1] Department of Applied Physics and Materials Science Center, University of Groningen, Nijenborgh 4, 9747 AG Groningen, Netherlands
Source

Synthetic metals. 1999, Vol 104, Num 3, pp 175-178 ; ref : 8 ref

CODEN
SYMEDZ
ISSN
0379-6779
Scientific domain
Electronics; Condensed state physics; Polymers, paint and wood industries
Publisher
Elsevier Science, Amsterdam / Elsevier Science, Lausanne / Elsevier Science, New York, NY
Publication country
Switzerland
Document type
Article
Language
English
Keyword (fr)
Composé benzénique condensé Composé pentacyclique Couche mince Diffraction RX Etude expérimentale Evaporation sous vide Hydrocarbure Microscopie force atomique Morphologie Pentacène Polycristal Transistor couche mince Substrat SiO2 Composé organique
Keyword (en)
Condensed benzenic compound Pentacyclic compound Thin films XRD Experimental study Vacuum evaporation Hydrocarbons Atomic force microscopy Morphology Pentacene Polycrystals Thin film transistors Organic compounds
Keyword (es)
Compuesto bencénico condensado Compuesto pentacíclico
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15E Vacuum deposition

Pacs
6855J Structure and morphology; thickness

Pacs
8115 Methods of deposition of films and coatings; film growth and epitaxy

Discipline
Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
1837013

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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