Wrapper design for the reuse of a bus, network-on-chip, or other functional interconnect as test access mechanism
- Author
- AMORY, A. M1 ; GOOSSENS, K2 3 ; MARINISSEN, E. J2 ; LUBASZEWSKI, M1 ; MORAES, F4
[1] Federal University of Rio Grande do Sul - UFRGS, Instituto de Informática, Av. Bento Gonçalves 9500, Porto Alegre, RS, Brazil
[2] NXP Semiconductors Research, High Tech Campus 37, 5656 AE Eindhoven, Netherlands
[3] University of Delft, Department of Computer Engineering, Mekelweg 5, 2628 CC Delft, Netherlands
[4] Catholic University - PUCRS, Faculdade de Informática, Av. Ipiranga 6681, Porto Alegre, RS, Brazil - Conference title
- Selected best papers from ETS'06
- Conference name
- ETS'06 : IEEE European Test Symposium (11 ; Southampton 2006-05)
- Author (monograph)
- LANDRAULT, Christian (Editor)1 ; MARINISSEN, Erik Jan (Editor)2
IEEE Computer Society, Test Technology Technical Council, Amissville, VA, United States (Organiser of meeting)
[1] LIRMM, France
[2] NXP Research, Netherlands - Source
IET computers & digital techniques (Print). 2007, Vol 1, Num 3, pp 197-206, 10 p ; ref : 39 ref
- ISSN
- 1751-8601
- Scientific domain
- Electronics; Computer science; Telecommunications
- Publisher
- Institution of Engineering and Technology, Stevenage
- Publication country
- United Kingdom
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Appareillage essai Architecture réseau Canal bus Circuit intégré Essai circuit intégré Essai fonctionnel Etude comparative Interconnexion Logique diode transistor Réseau interconnexion Réutilisation Système sur puce
- Keyword (en)
- Testing equipment Network architecture Bus(channel) Integrated circuit Integrated circuit testing Functional test Comparative study Interconnection Diode-transistor logic Interconnection network Reuse System on a chip
- Keyword (es)
- Aparato ensayo Arquitectura red Canal colector Circuito integrado Prueba funcional Estudio comparativo Interconexión Red interconexión Reutilización Sistema sobre pastilla
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03D Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18789652
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1049/iet-cdt:20060152 
https://dx.doi.org/10.1049/iet-cdt:20060152
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