Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure
- Author
- JUBLOT, M1 ; PAUMIER, F1 ; PAILLOUX, F1 ; LACROIX, B1 ; LEAU, E1 ; GUERIN, P1 ; MARTEAU, M1 ; JAOUEN, M1 ; GABORIAUD, R. J1 ; IMHOFF, D2
[1] Laboratoire de Métallurgie Physique, Université de Poitiers, CNRS-SP2MI-, BP 30179-86962, Chasseneuil-Futroscope, France
[2] Laboratoire de Physique des Solides, CNRS/Université Paris-Sud, UMR 8502, 91405 Orsay, France - Conference title
- Proceedings of Symposium J on Synthesis Processing and Characterization of Nanoscale Functional Oxide Films - EMRS 2006 Conference, Nice, May 29-June 2, 2006
- Conference name
- EMRS 2006 Conference, Symposium J: Synthesis Processing and Characterization of Nanoscale Functional Oxide Films (Nice 2006-05-29)
- Author (monograph)
- ALEXE, M (Editor); CRACIUN, V (Editor); GABORIAUD, R (Editor); KUMAR, D (Editor); EBIHARA, K (Editor)
European Materials Research Society, Strasbourg, France (Organiser of meeting) - Source
Thin solid films. 2007, Vol 515, Num 16, pp 6385-6390, 6 p ; ref : 13 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Crystallographic phases Oxygen vacancy network Rare Earth Oxyde Thin film
- Keyword (fr)
- Composé minéral Couche mince Diffraction RX Equilibre phase Hors équilibre Implantation ion Lacune Microscopie électronique transmission Microstructure Mécanisme formation Métal transition composé Pulvérisation faisceau ionique Réseau cubique Réseau monoclinique Résultat expérimental Silicium Spectrométrie perte énergie électron Stoechiométrie Structure cristalline Transformation phase Transition phase Yttrium oxyde 6172W 6855J 6855N 8115J Si Substrat MgO Substrat SrTiO3 Y2O3
- Keyword (en)
- Inorganic compounds Thin films XRD Phase equilibria Nonequilibrium Ion implantation Vacancies Transmission electron microscopy Microstructure Formation mechanism Transition element compounds Ion beam sputtering Cubic lattices Monoclinic lattices Experimental result Silicon EEL spectroscopy Stoichiometry Crystal structure Phase transformations Phase transitions Yttrium oxides
- Keyword (es)
- Mecanismo formacion Pulverización haz iónico Resultado experimental Transición fase
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72W Doping and impurity implantation in other materials
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55N Composition and phase identification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15J Ion and electron beam-assisted deposition; ion plating
- Discipline
- Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18794114
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2006.11.177 
https://dx.doi.org/10.1016/j.tsf.2006.11.177
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1016\/j.tsf.2006.11.177\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:100:\"Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure\";s:9:\"\u0000*\u0000jtitle\";s:16:\"Thin solid films\";s:9:\"\u0000*\u0000stitle\";s:16:\"Thin solid films\";s:7:\"\u0000*\u0000date\";s:4:\"2007\";s:9:\"\u0000*\u0000volume\";s:3:\"515\";s:8:\"\u0000*\u0000issue\";s:2:\"16\";s:8:\"\u0000*\u0000spage\";s:4:\"6385\";s:8:\"\u0000*\u0000epage\";s:4:\"6390\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0040-6090\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:6:\"JUBLOT\";s:10:\"\u0000*\u0000aufirst\";s:1:\"M\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:9:{i:0;s:10:\"PAUMIER, F\";i:1;s:11:\"PAILLOUX, F\";i:2;s:10:\"LACROIX, B\";i:3;s:7:\"LEAU, E\";i:4;s:9:\"GUERIN, P\";i:5;s:10:\"MARTEAU, M\";i:6;s:9:\"JAOUEN, M\";i:7;s:15:\"GABORIAUD, R. J\";i:8;s:9:\"IMHOFF, D\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"THSFAP\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:157:\"Proceedings of Symposium J on Synthesis Processing and Characterization of Nanoscale Functional Oxide Films - EMRS 2006 Conference, Nice, May 29-June 2, 2006\";s:8:\"\u0000*\u0000title\";s:100:\"Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure\";s:8:\"\u0000*\u0000place\";s:8:\"Lausanne\";s:6:\"\u0000*\u0000pub\";s:16:\"Elsevier Science\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"6\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1016\/j.tsf.2006.11.177\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:100:\"Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure\";s:9:\"\u0000*\u0000jtitle\";s:16:\"Thin solid films\";s:9:\"\u0000*\u0000stitle\";s:16:\"Thin solid films\";s:7:\"\u0000*\u0000date\";s:4:\"2007\";s:9:\"\u0000*\u0000volume\";s:3:\"515\";s:8:\"\u0000*\u0000issue\";s:2:\"16\";s:8:\"\u0000*\u0000spage\";s:4:\"6385\";s:8:\"\u0000*\u0000epage\";s:4:\"6390\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0040-6090\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:6:\"JUBLOT\";s:10:\"\u0000*\u0000aufirst\";s:1:\"M\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:9:{i:0;s:10:\"PAUMIER, F\";i:1;s:11:\"PAILLOUX, F\";i:2;s:10:\"LACROIX, B\";i:3;s:7:\"LEAU, E\";i:4;s:9:\"GUERIN, P\";i:5;s:10:\"MARTEAU, M\";i:6;s:9:\"JAOUEN, M\";i:7;s:15:\"GABORIAUD, R. J\";i:8;s:9:\"IMHOFF, D\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"THSFAP\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:157:\"Proceedings of Symposium J on Synthesis Processing and Characterization of Nanoscale Functional Oxide Films - EMRS 2006 Conference, Nice, May 29-June 2, 2006\";s:8:\"\u0000*\u0000title\";s:100:\"Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure\";s:8:\"\u0000*\u0000place\";s:8:\"Lausanne\";s:6:\"\u0000*\u0000pub\";s:16:\"Elsevier Science\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"6\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"UnpaywallOpenUrl\":35:{s:8:\"\u0000*\u0000email\";s:27:\"assistance-portail@inist.fr\";s:6:\"\u0000*\u0000fmt\";N;s:6:\"\u0000*\u0000doi\";s:25:\"10.1016\/j.tsf.2006.11.177\";s:6:\"\u0000*\u0000pii\";N;s:7:\"\u0000*\u0000pmid\";N;s:9:\"\u0000*\u0000atitle\";N;s:9:\"\u0000*\u0000jtitle\";N;s:9:\"\u0000*\u0000stitle\";N;s:7:\"\u0000*\u0000date\";N;s:9:\"\u0000*\u0000volume\";N;s:8:\"\u0000*\u0000issue\";N;s:8:\"\u0000*\u0000spage\";N;s:8:\"\u0000*\u0000epage\";N;s:8:\"\u0000*\u0000pages\";N;s:7:\"\u0000*\u0000issn\";N;s:8:\"\u0000*\u0000eissn\";N;s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";N;s:9:\"\u0000*\u0000aucorp\";N;s:7:\"\u0000*\u0000isbn\";N;s:8:\"\u0000*\u0000coden\";N;s:8:\"\u0000*\u0000genre\";N;s:7:\"\u0000*\u0000part\";N;s:9:\"\u0000*\u0000btitle\";N;s:8:\"\u0000*\u0000title\";N;s:8:\"\u0000*\u0000place\";N;s:6:\"\u0000*\u0000pub\";N;s:10:\"\u0000*\u0000edition\";N;s:9:\"\u0000*\u0000tpages\";N;s:9:\"\u0000*\u0000series\";N;s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";N;}"
Unpaywall access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1016\/j.tsf.2006.11.177\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:100:\"Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure\";s:9:\"\u0000*\u0000jtitle\";s:16:\"Thin solid films\";s:9:\"\u0000*\u0000stitle\";s:16:\"Thin solid films\";s:7:\"\u0000*\u0000date\";s:4:\"2007\";s:9:\"\u0000*\u0000volume\";s:3:\"515\";s:8:\"\u0000*\u0000issue\";s:2:\"16\";s:8:\"\u0000*\u0000spage\";s:4:\"6385\";s:8:\"\u0000*\u0000epage\";s:4:\"6390\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0040-6090\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:6:\"JUBLOT\";s:10:\"\u0000*\u0000aufirst\";s:1:\"M\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:9:{i:0;s:10:\"PAUMIER, F\";i:1;s:11:\"PAILLOUX, F\";i:2;s:10:\"LACROIX, B\";i:3;s:7:\"LEAU, E\";i:4;s:9:\"GUERIN, P\";i:5;s:10:\"MARTEAU, M\";i:6;s:9:\"JAOUEN, M\";i:7;s:15:\"GABORIAUD, R. J\";i:8;s:9:\"IMHOFF, D\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"THSFAP\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:157:\"Proceedings of Symposium J on Synthesis Processing and Characterization of Nanoscale Functional Oxide Films - EMRS 2006 Conference, Nice, May 29-June 2, 2006\";s:8:\"\u0000*\u0000title\";s:100:\"Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure\";s:8:\"\u0000*\u0000place\";s:8:\"Lausanne\";s:6:\"\u0000*\u0000pub\";s:16:\"Elsevier Science\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"6\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Europe PubMed Central access
"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1016\/j.tsf.2006.11.177\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:100:\"Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure\";s:9:\"\u0000*\u0000jtitle\";s:16:\"Thin solid films\";s:9:\"\u0000*\u0000stitle\";s:16:\"Thin solid films\";s:7:\"\u0000*\u0000date\";s:4:\"2007\";s:9:\"\u0000*\u0000volume\";s:3:\"515\";s:8:\"\u0000*\u0000issue\";s:2:\"16\";s:8:\"\u0000*\u0000spage\";s:4:\"6385\";s:8:\"\u0000*\u0000epage\";s:4:\"6390\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0040-6090\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:6:\"JUBLOT\";s:10:\"\u0000*\u0000aufirst\";s:1:\"M\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:9:{i:0;s:10:\"PAUMIER, F\";i:1;s:11:\"PAILLOUX, F\";i:2;s:10:\"LACROIX, B\";i:3;s:7:\"LEAU, E\";i:4;s:9:\"GUERIN, P\";i:5;s:10:\"MARTEAU, M\";i:6;s:9:\"JAOUEN, M\";i:7;s:15:\"GABORIAUD, R. J\";i:8;s:9:\"IMHOFF, D\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"THSFAP\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:157:\"Proceedings of Symposium J on Synthesis Processing and Characterization of Nanoscale Functional Oxide Films - EMRS 2006 Conference, Nice, May 29-June 2, 2006\";s:8:\"\u0000*\u0000title\";s:100:\"Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure\";s:8:\"\u0000*\u0000place\";s:8:\"Lausanne\";s:6:\"\u0000*\u0000pub\";s:16:\"Elsevier Science\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"6\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Base Search access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1016\/j.tsf.2006.11.177\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:100:\"Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure\";s:9:\"\u0000*\u0000jtitle\";s:16:\"Thin solid films\";s:9:\"\u0000*\u0000stitle\";s:16:\"Thin solid films\";s:7:\"\u0000*\u0000date\";s:4:\"2007\";s:9:\"\u0000*\u0000volume\";s:3:\"515\";s:8:\"\u0000*\u0000issue\";s:2:\"16\";s:8:\"\u0000*\u0000spage\";s:4:\"6385\";s:8:\"\u0000*\u0000epage\";s:4:\"6390\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0040-6090\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:6:\"JUBLOT\";s:10:\"\u0000*\u0000aufirst\";s:1:\"M\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:9:{i:0;s:10:\"PAUMIER, F\";i:1;s:11:\"PAILLOUX, F\";i:2;s:10:\"LACROIX, B\";i:3;s:7:\"LEAU, E\";i:4;s:9:\"GUERIN, P\";i:5;s:10:\"MARTEAU, M\";i:6;s:9:\"JAOUEN, M\";i:7;s:15:\"GABORIAUD, R. J\";i:8;s:9:\"IMHOFF, D\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"THSFAP\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:157:\"Proceedings of Symposium J on Synthesis Processing and Characterization of Nanoscale Functional Oxide Films - EMRS 2006 Conference, Nice, May 29-June 2, 2006\";s:8:\"\u0000*\u0000title\";s:100:\"Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure\";s:8:\"\u0000*\u0000place\";s:8:\"Lausanne\";s:6:\"\u0000*\u0000pub\";s:16:\"Elsevier Science\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"6\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
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