Protons at the Si-SiO2 interface : a first principle investigation
- Author
- GODET, Julien; PASQUARELLO, Alfredo
[1] Ecole Polytechnique Fédérale de Lausanne (EPFL), Institute of Theoretical Physics, 1015 Lausanne, Switzerland
[2] Institut Romand de Recherche Numérique en Physique des Matériaux (IRRMA), 1015 Lausanne, Switzerland - Conference title
- INFOS 2007: Proceedings of the 15th Biennial Conference on Insulating Films on Semiconductors, June 20-23, 2007, Glyfada Athens, Greece
- Conference name
- INFOS 2007 Biennial Conference on Insulating Films on Semiconductors (15 ; Glyfada Athens 2007-06-20)
- Author (monograph)
- DIMOULAS, A (Editor)1 ; NORMAND, P (Editor)1
NCSR Demokritos, Athens, Greece (Organiser of meeting)
National Technical University of Athens, Athens, Greece (Organiser of meeting)
University of Ioannina, Ioannina, Greece (Organiser of meeting)
[1] NCSR Demokritos, Athens, Greece - Source
Microelectronic engineering. 2007, Vol 84, Num 9-10, pp 2035-2038, 4 p ; ref : 27 ref
- CODEN
- MIENEF
- ISSN
- 0167-9317
- Scientific domain
- Electronics
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Si-SiO2 interface defect proton
- Keyword (fr)
- Contact isolant semiconducteur Energie interface
- Keyword (en)
- Semiconductor insulator contact Interface energy
- Keyword (es)
- Contacto aislante semiconductor Energía interfase
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F01 Interfaces
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 18853504
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.mee.2007.04.122 
https://dx.doi.org/10.1016/j.mee.2007.04.122
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