Reliability assessment of aerospace electronic equipment : Customer demands for quality and reliability for critical applications
- Author
- CONDRA, L1 ; BOSCO, C2 ; DEPPE, R1 ; GULLO, L3 ; TREACY, J4 ; WILKINSON, C5
[1] The Boeing Company, Seattle, WA, United States
[2] Federal Aviation Administration, Burlington, MA, United States
[3] Honeywell, Phoenix, AZ, United States
[4] Federal Aviation Administration, Seattle, WA, United States
[5] Smiths Industries, Cheltenham, United Kingdom - Source
Quality and reliability engineering international. 1999, Vol 15, Num 4, pp 253-260 ; ref : 24 ref
- CODEN
- QREIE5
- ISSN
- 0748-8017
- Scientific domain
- Control theory, operational research
- Publisher
- Wiley, Chichester
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Appareillage électronique Avionique Electronique Fiabilité Industrie aérospatiale Rupture Taux défaillance
- Keyword (en)
- Electronic equipment Avionics Electronics Reliability Aerospace industry Rupture Failure rate
- Keyword (es)
- Equipo electrónico Aviónica Electrónica Fiabilidad Industria aeroespacial Ruptura Porcentaje falla
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D01 Operational research. Management science / 001D01A Operational research and scientific management / 001D01A06 Reliability theory. Replacement problems
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Discipline
- Electronics Operational research. Management
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 1916563
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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