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Influence of deformation and residual stresses in metals on the electronic work function

Author
LEVITIN, V. V; LISKUTOV, S. V; POGOSOV, V. V
Source

Physics of metals and metallography. 1990, Vol 70, Num 3, pp 70-76, 7 p ; ref : 21 ref

CODEN
PHMMA6
ISSN
0031-918X
Scientific domain
Metallurgy, welding; Condensed state physics
Publisher
Interperiodica, Birmingham, AL
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Aluminium Contrainte résiduelle Densité électron Déformation Etat électronique surface Etude expérimentale Etude théorique Fonction densité Métal transition Nickel Travail sortie
Keyword (en)
Aluminium Residual stress Electron density Deformation Surface electron state Experimental study Theoretical study Density function Transition metal Nickel Work function
Keyword (es)
Aluminio Tensión residual Densidad electrón Deformación Estado electrónico superficie Estudio experimental Estudio teórico Función densidad Metal transición Niquel Función de trabajo
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C20 Surface and interface electron states

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy

Discipline
Metals. Metallurgy Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
19858329

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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