Epitaxial C60 thin films on Bi(0001)
- Author
- SADOWSKI, J. T1 ; BAKHTIZIN, R. Z2 ; ORESHKIN, A. I3 ; NISHIHARA, T1 ; AL-MAHBOOB, A1 ; FUJIKAWA, Y1 ; NAKAJIMA, K1 ; SAKURAI, T1
[1] Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan
[2] Moscow State University, Department of Physics, Moscow 119992, Russian Federation
[3] Department of Physical Electronics, Bashkir State University, Ufa 450074, Russian Federation - Source
Surface science. 2007, Vol 601, Num 23 ; L136-L139 ; ref : 17 ref
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- Russian
- Author keyword
- Epitaxy Fullerenes Low energy electron diffraction (LEED) Low-energy electron microscopy (LEEM) Scanning tunneling microscopy
- Keyword (fr)
- Couche mince Couche épitaxique Electron lent Epitaxie Fullerènes LEED Microscopie tunnel balayage C60
- Keyword (en)
- Thin films Epitaxial layers Low energy electron Epitaxy Fullerenes LEED Scanning tunneling microscopy
- Keyword (es)
- Electrón lento
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 19867196
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.susc.2007.10.005 
https://dx.doi.org/10.1016/j.susc.2007.10.005
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