Polymeric membrane studied using slow positron beam

Author

HUNG, Wei-Song^{1 2} ; LO, Chia-Hao^{1 2} ; LAI, Juin-Yih^{1 2} ; SUN, Yi-Ming^{1 4} ; YU, Chang-Cheng^{1 5} ; RENWU ZHANG⁶ ; JEAN, Y. C^{1 2 3} ; CHENG, Mei-Ling^{3 4} ; HONGMIN CHEN³ ; GUANG LIU³ ; CHAKKA, Lakshmi³ ; NANDA, D^{1 2} ; TUNG, Kuo-Lun^{1 2} ; HUANG, Shu-Hsien^{1 2} ; LEE, Kueir-Rarn^{1 2}
[1] R&D Center for Membrane Technology, Chung Yuan Christian University, Chung-Li 32023, Taiwan, Province of China
[2] Department of Chemical Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan, Province of China
[3] Department of Chemistry, University of Missouri-Kansas City, Kansas City, MO 64110, United States
[4] Department of Chemical Engineering and Materials Science, Yuan Ze University, Chung-Li 32003, Taiwan, Province of China
[5] Department of Physics, Chung Yuan Christian University, Chung-Li 32023, Taiwan, Province of China
[6] Physical Science Department, Southern Utah University, Cedar City, UT 84720, United States

Source

Applied surface science. 2008, Vol 255, Num 1, pp 201-204, 4 p ; ref : 31 ref

ISSN

0169-4332

Scientific domain

General chemistry, physical chemistry; Crystallography; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics

Publisher

Elsevier, Amsterdam

Publication country

Netherlands

Document type

Article

Language

English

Author keyword

82.30.Gg 82.80.-d 87.80.-y 87.83.+a Free volume Membrane Polyacrylonitrile Polyamide Positron annihilation

Keyword (fr)

Annihilation positon Dépendance énergie Elargissement Doppler Faisceau positon Matériau poreux Membrane polymère Multicouche Polymérisation Profil profondeur Radioisotope Volume libre

Keyword (en)

Positron annihilation Energy dependence Doppler broadening Positron beams Porous materials Polymeric membrane Multilayers Polymerization Depth profiles Radioisotopes Free volume

Keyword (es)

Membrana polímero Volumen libre

Classification

Pascal

001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H65 Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties

Pascal

001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H70 Other interactions of matter with particles and radiation / 001B70H70B Positron annihilation

Pascal

001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A70 Materials testing

Pacs

7870B Positron annihilation

Pacs

8170J Chemical composition analysis, chemical depth and dopant profiling

Discipline

Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties

Origin

Inist-CNRS

Database

PASCAL

INIST identifier

20810715

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS