Stress of needle specimen on the three-dimensional atom probe (3DAP)

Author

MAYAMA, N¹ ; YAMASHITA, C¹ ; KAITO, T² ; NOJIMA, M³ ; OWARI, M^{1 4}
[1] Institute of Industrial Science, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
[2] Sll Nanotechnology Inc., 36-1 Takenoshita, Oyama-cho, Sunto-gun, Shizuoka 410-1393, Japan
[3] Research Institute of Science and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510, Japan
[4] Environmental Science Center, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan

Conference title

International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 2007), Kanazawa, Japan, 28 October-2 November 2007

Conference name

International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 2007) (ALC 2007) (6 ; Kanazawa 2007-10-28)

Author (monograph)

KAWAI, J (Editor); TANAKA, K (Editor); TAKAKUWA, Y (Editor); TSUYUMOTO, I (Editor); ASAKURA, K (Editor); ETOH, T. G (Editor); FUJII, Y (Editor); HATA, K (Editor); IKUTA, T (Editor); KIDO, Y (Editor); SAITO, Y (Editor); SHIMIZU, R (Editor)
Japan Society for the Promotion of Science (JSPS), Japan (Organiser of meeting)

Source

Surface and interface analysis. 2008, Vol 40, Num 13, pp 1610-1613, 4 p ; ref : 7 ref

CODEN

SIANDQ

ISSN

0142-2421

Scientific domain

General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics

Publisher

Wiley, Chichester

Publication country

United Kingdom

Document type

Conference Paper

Language

English

Author keyword

3DAP electric stress local electrode simulation

Keyword (fr)

Contrainte électrique Distribution contrainte Evaporation champ Rupture Simulation Sonde atomique Système 3 dimensions

Keyword (en)

Electric stress Stress distribution Field evaporation Ruptures Simulation Atom probe Three-dimensional systems

Keyword (es)

Tensión eléctrica Sonda atómica

Classification

Pascal

001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy

Discipline

Physics of condensed state : structure, mechanical and thermal properties

Origin

Inist-CNRS

Database

PASCAL

INIST identifier

21018692

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS