Poly(3,4-ethylenedioxythiophene)/poly(4-styrenesulfonate) : Correlation between colloidal particles and thin films
- Author
- HU YAN1 ; ARIMA, Susumu2 ; MORI, Yusaku1 ; KAGATA, Tsubasa1 ; SATO, Hiroshi2 ; OKUZAKI, Hidenori1
[1] Laboratory of Organic Robotics, Interdisciplinary Graduate School of Medicine and Engineering, University of Yamanashi, 4-4-37 Takeda, Kofu 400-8511, Japan
[2] Technology Development Center, TOKYO ELECTRON LTD, Nirasaki 407-0192, Japan - Source
Thin solid films. 2009, Vol 517, Num 11, pp 3299-3303, 5 p ; ref : 20 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Atomic force microscopy (AFM) Polymer Transmission electron microscopy (TEM) X-ray photoelectron spectroscopy (XPS)
- Keyword (fr)
- Argent Couche mince Couche monomoléculaire Diffusion lumière Dispersion Dépôt centrifugation Epaisseur couche Fullerènes Microscopie force atomique Microscopie électronique balayage transmission Microscopie électronique transmission Nanomatériau Nanoparticule Particule colloïdale Pastille électronique Polymère Procédé sol gel Pulvérisation irradiation Revêtement centrifugation Silicium Spectre photoélectron RX Spectrométrie dispersive Styrènesulfonate polymère Thiophène dérivé polymère Thiophène polymère pH 6855J 8105T 8107 8115C C60 Si
- Keyword (en)
- Silver Thin films Monolayers Light scattering Dispersions Spin-on coating Layer thickness Fullerenes Atomic force microscopy Scanning transmission electron microscopy Transmission electron microscopy Nanostructured materials Nanoparticles Colloid particle Wafers Polymers Sol-gel process Sputtering Spin-on coatings Silicon X-ray photoelectron spectra Dispersive spectrometry Styrenesulfonate polymer Thiophene derivative polymer Thiophene polymer pH value
- Keyword (es)
- Espesor capa Partícula coloidal Espectrometría dispersiva Estireno sulfonato polímero Tiofeno derivado polímero Tiofeno polímero
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A05 Specific materials / 001B80A05T Fullerenes and related materials; diamonds, graphite
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A07 Nanoscale materials and structures: fabrication and characterization / 001B80A07Z Other topics in nanoscale materials and structures
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15C Deposition by sputtering
- Discipline
- Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21398666
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2009.01.004 
https://dx.doi.org/10.1016/j.tsf.2009.01.004
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