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Optical investigations of germanium nanoclusters - Rich SiO2 layers produced by ion beam synthesis

Author
KRZYZANOWSKA, H1 ; KULIK, M1 ; ZUK, J1 ; RZODKIEWICZ, W2 ; KOBZEV, A. P3 ; SKORUPA, W4
[1] Institute of Physics, Maria Curie-Skiodowska University, Pl. M. Curie-Skłodowskiej 1, 20-031 Lublin, Poland
[2] Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warszawa, Poland
[3] Joint Institute for Nuclear Research, Frank Laboratory of Neutron Physics, 141980 Dubna, Moscow Region, Russian Federation
[4] Institute oflon Beam Physics and Materials Research, Forschungszentrum Rossendorf, P.O. Box 510119, 01314 Dresden, Germany
Conference title
Functional and Nanostructured Materials
Conference name
Workshop on Functional and Nanostructured Materials (5 ; L'viv 2008-08-31)
Author (monograph)
RYBICKI, Jarosław (Editor)1 ; WOJCIECHOWSKI, Krzystof (Editor)2
[1] Gdansk University of Technology, Faculty of Technical Physics and Applied Math., Narutowicza 11/12, 80-952 Gdansk, Poland
[2] Institute of Molecular Physics, Polish Academy of Sciences, M. Smoluchowskiego 17, 60-179 Poznan, Poland
Source

Journal of non-crystalline solids. 2009, Vol 355, Num 24-27, pp 1347-1354, 8 p ; ref : 23 ref

CODEN
JNCSBJ
ISSN
0022-3093
Scientific domain
Crystallography; Chemical industry parachemical industry; Condensed state physics
Publisher
Elsevier, Oxford
Publication country
United Kingdom
Document type
Conference Paper
Language
Russian
Author keyword
61.72.uf 68.55.Ln 78.67.-n 82.80.Yc Ge nanostructures Ion implantation Optical constants Rutherford backscattering Spectroscopic ellipsometry
Keyword (fr)
Agrégat solide Confinement quantique Couche mince Distribution concentration Ellipsométrie spectroscopique Germanium Implantation ion Indice extinction Indice réfraction Nanoamas Nanocomposite Oxyde de silicium Profil profondeur RBS Recuit Variation angulaire SiO2
Keyword (en)
Solid clusters Quantum confinement Thin films Concentration distribution Spectroscopic ellipsometry Germanium Ion implantation Extinction index Refractive index Nanocluster Nanocomposites Silicon oxides Depth profiles RBS Annealing Angular variation
Keyword (es)
Confinamiento cuántico Distribución concentración Elipsometría espectroscópica Nanomontón Variación angular
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films / 001B70H66S Composite materials

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
21946374

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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