Electrical, structural and optical applicate characterization of copper oxide thin films as a function of post annealing temperature
- Author
- FIGUEIREDO, V1 ; ELANGOVAN, E1 ; GONCALVES, G1 ; FRANCO, N2 ; ALVES, E2 ; PARK, S. H. K3 ; MARTINS, R1 ; FORTUNATO, E1
[1] Materials Science Department, CENIMAT-I3N and CEMOP-UNINOVA, FCT-UNL, Campus da Caparica, 2829-516 Caparica, Portugal
[2] LFI, Dep. Física, Instituto Tecnológico e Nuclear, EN10, 2686-953 Sacavém, Portugal
[3] Basic Research Laboratory, Electronics and Telecommunications Research Institute, Transparent Electronics Team, Yusong-gu, Daejeon 305-350, Korea, Republic of - Conference name
- Flexible and Transparent Electronics: From Materials to Devices. Symposium (Warsaw 2008-09-15)
- Source
Physica status solidi. A, Applications and materials science (Print). 2009, Vol 206, Num 9, pp 2143-2148, 6 p ; ref : 24 ref
- ISSN
- 1862-6300
- Scientific domain
- Crystallography; Electronics; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
- Publisher
- Wiley-VCH, Berlin
- Publication country
- Germany
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Bande interdite Coefficient absorption Conductivité électrique Couche mince Diffraction RX Effet température Energie activation Evaporation faisceau électronique Microstructure Oxyde de cuivre Paramètre cristallin Recuit Réseau cubique Semiconducteur Spectre absorption Cu2O
- Keyword (en)
- Energy gap Absorption coefficients Electrical conductivity Thin films XRD Temperature effects Activation energy Electron beam evaporation Microstructure Copper oxide Lattice parameters Annealing Cubic lattices Semiconductor materials Absorption spectra
- Keyword (es)
- Cobre óxido
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C61 Electrical properties of specific thin films / 001B70C61L Other inorganic semiconductors
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films / 001B70H66L Other semiconductors
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21979514
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/pssa.200881797 
https://dx.doi.org/10.1002/pssa.200881797
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