Enabling application-level performance guarantees in network-based systems on chip by applying dataflow analysis
- Author
- HANSSON, A1 ; WIGGERS, M2 ; MOONEN, A1 ; GOOSSENS, K3 4 ; BEKOOIJ, M4
[1] Eindhoven University of Technology, Eindhoven, Netherlands
[2] University of Twente, Enschede, Netherlands
[3] Delft University of Technology, Delft, Netherlands
[4] Research, NXP Semiconductors, Eindhoven, Netherlands - Issue title
- Networks on Chip
- Author (monograph)
- BERTOZZI, Davide (Author of introductory parts)1 ; GOOSSENS, Kees (Author of introductory parts)2
[1] ENDIF, University of Ferrara, Ferrara 44100, Italy
[2] Delft University of Technology, Delft, Netherlands - Source
IET computers & digital techniques (Print). 2009, Vol 3, Num 5, pp 398-412, 15 p ; ref : 40 ref
- ISSN
- 1751-8601
- Scientific domain
- Electronics; Computer science; Telecommunications
- Publisher
- Institution of Engineering and Technology, Stevenage
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Architecture réseau Circuit intégré Consommation énergie électrique Dimensionnement Etude cas Evaluation performance Flux donnée Logiciel Méthode analytique Propriété intellectuelle Réseau interconnexion Système sur puce Temps exécution Approche multimodèles
- Keyword (en)
- Network architecture Integrated circuit Power consumption Dimensioning Case study Performance evaluation Data flow Software Analytical method Intellectual property Interconnection network System on a chip Execution time Multiple models approach
- Keyword (es)
- Arquitectura red Circuito integrado Dimensionamiento Estudio caso Evaluación prestación Flujo datos Logicial Método analítico Propiedad intelectual Red interconexión Sistema sobre pastilla Tiempo ejecución
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 22002501
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1049/iet-cdt.2008.0093 
https://dx.doi.org/10.1049/iet-cdt.2008.0093
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