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High performance InP Geiger-mode SWIR avalanche photodiodes

Author
PING YUAN1 ; SUDHARSANAN, Rengarajan1 ; CAMPBELL, Joe C3 ; BOISVERT, Joseph1 ; XIAOGANG BAI1 ; MCDONALD, Paul1 ; ISSHIKI, Takahiro1 ; HONG, William1 ; SALISBURY, Michael2 ; CHONG HU3 ; MINGGUO LIU3
[1] Boeing Spectrolab Inc. 12500 Gladstone Ave, Sylmar, CA 91342, United States
[2] Boeing SVS Inc., 4411 The 25 Way NE # 350, Albuquerque, NM 87109, United States
[3] University of Virginia, Electrical and Computer Engineering, 351 McCormick Rd, Charlottesville, VA 22904-4743, United States
Conference title
Advanced photon counting techniques III (14-16 April 2009, Orlando, Florida, United States)
Conference name
Advanced photon counting techniques (03 ; Orlando FL 2009)
Author (monograph)
Itzler, Mark A (Editor); Campbell, Joe C (Editor)
SPIE, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7320 ; 1Vol ; 73200P.1-73200P.9 ; ref : 6 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-7586-2 0-8194-7586-6
Scientific domain
Electronics; Metrology and instrumentation; Optics; Physics
Publisher
SPIE, Bellingham WA
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Application militaire Composé binaire Composé quaternaire Comptage photon Epaisseur couche Gallium Arséniure Gallium Phosphure Imagerie Indium Arséniure Indium Phosphure Matrice détecteur Photodiode avalanche Résolution temporelle Semiconducteur III-V 0130C 0707D 4250A 8560D 8920D As Ga In P In P InGaAsP InP
Keyword (en)
Military application Binary compounds Quaternary compounds Photon counting Layer thickness Gallium Arsenides Gallium Phosphides Imagery Indium Arsenides Indium Phosphides Dectector arrays Avalanche photodiodes Time resolution III-V semiconductors
Keyword (es)
Aplicación militar Espesor capa Imaginería
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques / 001B00G07D Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B50 Quantum optics / 001B40B50A Photon statistics and coherence theory

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F15 Optoelectronic devices

Discipline
Electronics Metrology Physics : optics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
22130773

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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