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Crosstalk Analysis of Integrated Geiger-mode Avalanche Photodiode Focal Plane Arrays

Author
YOUNGER, Richard D1 ; MCINTOSH, K. Alex1 ; CHLUDZINSKI, Joseph W1 ; OAKLEY, Douglas C1 ; MAHONEY, Leonard J1 ; FUNK, Joseph E1 ; DONNELLY, Joseph P1 ; VERGHESE, S1
[1] Lincoln Laboratory, Massachusetts Institute of Technology, 244 Wood St., Lexington, MA, 02420-9108, United States
Conference title
Advanced photon counting techniques III (14-16 April 2009, Orlando, Florida, United States)
Conference name
Advanced photon counting techniques (03 ; Orlando FL 2009)
Author (monograph)
Itzler, Mark A (Editor); Campbell, Joe C (Editor)
SPIE, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7320 ; 1Vol ; 73200Q.1-73200Q.12 ; ref : 8 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-7586-2 0-8194-7586-6
Scientific domain
Electronics; Metrology and instrumentation; Optics; Physics
Publisher
SPIE, Bellingham WA
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Comptage photon Matrice plan focal Méthode mesure Photodiode avalanche 0130C 0707D 4250A 8560D
Keyword (en)
Photon counting Focal plane arrays Measuring methods Avalanche photodiodes
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques / 001B00G07D Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B50 Quantum optics / 001B40B50A Photon statistics and coherence theory

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F15 Optoelectronic devices

Discipline
Electronics Metrology Physics : optics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
22130774

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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