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Polarization-Induced Hole Doping in Wide―Band-Gap Uniaxial Semiconductor Heterostructures

Author
SIMON, John1 ; PROTASENKO, Vladimir1 ; CHUANXIN LIAN1 ; HUILI XING1 ; JENA, Debdeep1
[1] Department of Electrical Engineering, University of Notre Dame, 275 Fitzpatrick Hall, Notre Dame, IN 46556, United States
Source

Science (Washington, D.C.). 2010, Vol 327, Num 5961, pp 60-64, 5 p

CODEN
SCIEAS
ISSN
0036-8075
Scientific domain
Multidisciplinary
Publisher
American Association for the Advancement of Science, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Centre accepteur Conductivité type p Conductivité électrique Cristal uniaxe Densité trou Dopage Effet Hall Energie activation Hétérostructure Impureté Polarisation Semiconducteur bande interdite large
Keyword (en)
Acceptor center P type conductivity Electrical conductivity Uniaxial crystals Hole density Doping Hall effect Activation energy Heterostructures Impurities Polarization Wide band gap semiconductors
Keyword (es)
Centro aceptor Conductividad tipo p Cristal uniáxico Doping
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C63 Electronic transport in multilayers, nanoscale materials and structures

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
22280690

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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