Effect of Heating Value on Contact Diameter at Low Speed Breaking Contact : Recent Development of Electro-Mechanical Devices (IS-EMD2008)
- Author
- MIYANAGA, Kazuaki1 ; KAYANO, Yoshiki1 ; TAKAGI, Tasuku2 ; INOUE, Hiroshi1
[1] Department of Electrical and Electronic Engineering, Akita University, Akita-shi, 010-8502, Japan
[2] Tohoku University, Sendai-shi, 981-0952, Japan - Source
IEICE transactions on electronics. 2009, Vol 92, Num 8, pp 1020-1022, 3 p ; ref : 6 ref
- ISSN
- 0916-8524
- Scientific domain
- Electronics
- Publisher
- Oxford University Press, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- bridge contact area electrical contact low speed breaking
- Keyword (fr)
- Contact électrique Durabilité Equilibre thermique Fiabilité Résistance contact
- Keyword (en)
- Electric contact Durability Thermal equilibrium Reliability Contact resistance
- Keyword (es)
- Contacto eléctrico Durabilidad Equilibrio térmico Fiabilidad Resistencia contacto
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F01 Interfaces
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 22607231
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1587/transele.E92.C.1020 
https://dx.doi.org/10.1587/transele.E92.C.1020
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