Quantification of Thin Film Crystallographic Orientation Using X-ray Diffraction with an Area Detector
- Author
- BAKER, Jessy L1 ; JIMISON, Leslie H4 ; MANNSFELD, Stefan5 ; VOLKMAN, Steven3 ; SHONG YIN3 ; SUBRAMANIAN, Vivek3 ; SALLEO, Alberto4 ; ALIVISATOS, A. Paul2 ; TONEY, Michael F5
[1] Department of Mechanical Engineering, University of California, Berkeley, Berkeley California 94720, United States
[2] Department of Chemistry, University of California, Berkeley, Berkeley California 94720, United States
[3] Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, Berkeley California 94720, United States
[4] Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
[5] Stanford Synchrotron Radiation Lightsource, Menlo Park, California 94025, United States - Source
Langmuir. 2010, Vol 26, Num 11, pp 9146-9151, 6 p
- Publisher
- American Chemical Society, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Autoassemblage Couche mince Diffraction RX Dispositif Détecteur Fibre Film Géométrie Microstructure Microélectronique Méthodologie Nanoparticule Optoélectronique Orientation Polymère Propriété mécanique Propriété optique Semiconducteur Texture
- Keyword (en)
- Self assembly Thin film X ray diffraction Device Detector Fiber Film Geometry Microstructure Microelectronics Methodology Nanoparticle Optoelectronics Orientation Polymer Mechanical properties Optical properties Semiconductor materials Texture
- Keyword (es)
- Autoensamble Capa fina Difracción RX Dispositivo Detector Fibra Película Geometría Microestructura Microelectrónica Metodología Nanopartícula Optoelectrónica Orientación Polímero Propiedad mecánica Propiedad óptica Semiconductor(material) Textura
- Classification
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry / 001C01I Surface physical chemistry
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry / 001C01J Colloidal state and disperse state / 001C01J02 Physical and chemical studies. Granulometry. Electrokinetic phenomena
- Discipline
- General chemistry and physical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 22825429
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1021/la904840q 
https://dx.doi.org/10.1021/la904840q
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