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Random variability modeling and its impact on scaled CMOS circuits

Author
YUN YE1 ; GUMMALLA, Samatha1 ; WANG, Chi-Chao1 ; CHAKRABARTI, Chaitali1 ; YU CAO1
[1] School of Electrical, Computer and Energy Engineering (ECEE), Arizona State University, Tempe, AZ 85287-5706, United States
Source

Journal of computational electronics (Print). 2010, Vol 9, Num 3-4, pp 108-113, 6 p ; ref : 15 ref

ISSN
1569-8025
Scientific domain
Electronics
Publisher
Springer, Heidelberg
Publication country
Germany
Document type
Article
Language
English
Author keyword
Atomistic simulation Inverter Line-edge roughness Oxide thickness fluctuation Predictive modeling Random dopant fluctuation SRAM performance variability Threshold variations
Keyword (fr)
Analyse quantitative Circuit intégré CMOS Circuit intégré Conception compacte Conception optimale Couche oxyde Epaisseur Evaluation performance Extensibilité Fluctuation Miniaturisation Modélisation Mémoire accès direct statique Onduleur Rugosité Technologie MOS complémentaire Mémoire accès direct Mémoire non volatile
Keyword (en)
Quantitative analysis CMOS integrated circuits Integrated circuit Compact design Optimal design Oxide layer Thickness Performance evaluation Scalability Fluctuations Miniaturization Modeling Static random access memory Inverter Roughness Complementary MOS technology Random access memory Non volatile memory
Keyword (es)
Análisis cuantitativo Circuito integrado Concepción compacta Concepción optimal Capa óxido Espesor Evaluación prestación Estensibilidad Fluctuación Miniaturización Modelización Ondulador Rugosidad Tecnología MOS complementario Memoria acceso directo Memoria no volátil
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03D Electronic equipment and fabrication. Passive components, printed wiring boards, connectics

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
23598953

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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