Bipolar Integrated Circuits in 4H-SiC
- Author
- SINGH, Shakti1 ; COOPER, James A1
[1] School of Electrical and Computer Engineering and the Birck Nanotechnology Center, Purdue University, West Lafayette, IN 47907, United States - Source
I.E.E.E. transactions on electron devices. 2011, Vol 58, Num 4, pp 1084-1090, 7 p ; ref : 27 ref
- CODEN
- IETDAI
- ISSN
- 0018-9383
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- High-temperature integrated circuits (ICs) SiC ICs silicon carbide (SiC) smart power transistor-transistor logic (TTL)
- Keyword (fr)
- Carbure de silicium Champ intense Champ électrique Circuit intégré bipolaire Circuit intégré numérique bipolaire Circuit intégré Couche oxyde Fabrication microélectronique Fiabilité Haute température Logique transistor transistor Métallisation Passivation Semiconducteur bande interdite large Structure petite échelle Système intelligent Transistor bipolaire SiC
- Keyword (en)
- Silicon carbide High field Electric field Bipolar integrated circuits Bipolar digital integrated circuits Integrated circuit Oxide layer Microelectronic fabrication Reliability High temperature Transistor transistor logic Metallizing Passivation Wide band gap semiconductors Small scale structure Intelligent system Bipolar transistor
- Keyword (es)
- Silicio carburo Campo intenso Campo eléctrico Circuito integrado Capa óxido Fabricación microeléctrica Fiabilidad Alta temperatura Lógica transistor transistor Metalización Pasivación Estructura pequeña escala Sistema inteligente Transistor bipolar
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 24041849
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TED.2011.2107576 
https://dx.doi.org/10.1109/TED.2011.2107576
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