Two-photon absorption laser assisted device alteration using continuous wave 1,340 nm laser
- Author
- NIU, Baohua1 ; PARDY, Patrick1 ; FORTIER, Jerry1 ; ORTEGA, Mel1 ; EILES, Travis1
[1] Intel Corporation, MS. RA1-319, 2501 NW 229th Avenue, Hillsboro, OR 97124, United States - Issue title
- Failure Analysis in Electronics: An EDFAS Special Issue
- Author (monograph)
- KNAUSS, Lee (Editor)
[1] Booz Allen Hamilton, 5825 University Research Court, Suite 1100, College Park, MD 20740, United States - Source
Journal of materials science. Materials in electronics. 2011, Vol 22, Num 10, pp 1542-1552, 11 p ; ref : 17 ref
- ISSN
- 0957-4522
- Scientific domain
- Electronics; Condensed state physics
- Publisher
- Springer, Norwell, MA
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Absorption 2 photons Absorption photon Circuit fonction temps Circuit intégré CMOS Courant photoélectrique Débogage Haute résolution Localisation défaut Onde entretenue Photoconductivité Processus assisté laser Résolution temporelle Semiconducteur Spectre résolution temporelle Technologie MOS complémentaire
- Keyword (en)
- Two photon absorption Photon absorption Timing circuits CMOS integrated circuits Photoelectric current Debugging High resolution Defect localization Continuous wave Photoconductivity Laser assisted process Time resolution Semiconductor materials Time resolved spectra Complementary MOS technology
- Keyword (es)
- Absorción 2 fotones Absorción fotón Corriente fotoeléctrica Puesta a punto programa Alta resolucion Localización imperfección Onda continua Fotoconductividad Proceso asistido láser Resolución temporal Semiconductor(material) Tecnología MOS complementario
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 24749782
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/s10854-011-0458-y 
https://dx.doi.org/10.1007/s10854-011-0458-y
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