Multielectron processes in collisions of Xe23+ ions with Ar atoms
- Author
- DING, B. W1 ; YU, D. Y2 ; SHAO, C. J2 3 ; LU, R. C2 ; RUAN, F. F2 ; LI, H. C1 ; ZHANG, W. J1 ; CAI, X. H2
[1] School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000, China
[2] Institute of Modern Physics, Chinese Academy of Science, Lanzhou 730000, China
[3] Graduate School of the Chinese Academy of Sciences, Beijing 100049, China - Source
The European physical journal. D, Atomic, molecular and optical physics (Print). 2011, Vol 65, Num 3, pp 391-396, 6 p ; ref : 22 ref
- ISSN
- 1434-6060
- Scientific domain
- Optics; Atomic molecular physics
- Publisher
- EDP Sciences, Les Ulis
- Publication country
- France
- Document type
- Article
- Language
- English
- Keyword (fr)
- Argon Atome Collision ion atome Ion multichargé Loi échelle Méthode mesure Méthode temps vol Section efficace Xénon Ion atomique 3450F Ar Xe ip 23
- Keyword (en)
- Argon Atoms Ion-atom collisions Multicharged ions Scaling laws Measuring methods Time-of-flight method Cross sections Xenon Atomic ions
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B30 Atomic and molecular physics / 001B30D Atomic and molecular collision processes and interactions / 001B30D50 Scattering of atoms, molecules and ions / 001B30D50F Electronic excitation and ionization of atoms (including beam-foil excitation and ionization)
- Discipline
- Atomic and molecular physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 25349808
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1140/epjd/e2011-20511-7 
https://dx.doi.org/10.1140/epjd/e2011-20511-7
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