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Size-dependent deformation mechanisms and strain-rate sensitivity in nanostructured Cu/X (X = Cr, Zr) multilayer films

Author
NIU, J. J1 ; ZHANG, J. Y1 ; LIU, G1 ; ZHANG, P1 ; LEI, S. Y1 ; ZHANG, G. J1 ; SUN, J1
[1] State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an 710049, China
Source

Acta materialia. 2012, Vol 60, Num 9, pp 3677-3689, 13 p ; ref : 72 ref

ISSN
1359-6454
Scientific domain
Metallurgy, welding; Condensed state physics
Publisher
Elsevier, Kidlington
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
Deformation mechanisms Multilayer films Size effect Strain-rate sensitivity
Keyword (fr)
Couche mince Déformation Effet dimensionnel Multicouche Mécanisme Nanostructure Propriété mécanique Sensibilité vitesse déformation Vitesse déformation
Keyword (en)
Thin film Deformation Size effect Multiple layer Mechanism Nanostructure Mechanical properties Strain rate sensitivity Strain rate
Keyword (es)
Capa fina Deformación Efecto dimensional Capa múltiple Mecanismo Nanoestructura Propiedad mecánica Sensibilidad velocidad deformación Velocidad deformación
Keyword (de)
Duennschicht Verformung Groesseneffekt Mehrfachschicht Dehngeschwindigkeitsempfindlichkeit Verformungsgeschwindigkeit
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy / 001D11A General

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy / 001D11G Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology

Discipline
Metals. Metallurgy Physics and materials science
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
25911619

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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