Contrast inversion of the h-BN nanomesh investigated by nc-AFM and Kelvin probe force microscopy

KOCH, S; LANGER, M; KAWAI, S; MEYER, E; GLATZEL, Th

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Contrast inversion of the h-BN nanomesh investigated by nc-AFM and Kelvin probe force microscopy

Author

KOCH, S¹ ; LANGER, M¹ ; KAWAI, S¹ ; MEYER, E¹ ; GLATZEL, Th¹
[1] Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland

Source

Journal of physics. Condensed matter (Print). 2012, Vol 24, Num 31 ; 314212.1-314212.9 ; ref : 44 ref

CODEN: JCOMEL
ISSN: 0953-8984
Scientific domain: Crystallography; Metallurgy, welding; Condensed state physics

Publisher

Institute of Physics, Bristol

Publication country: United Kingdom

Document type

Article

Language: English

Keyword (fr)

Contraste image Déformation élastique Energie liaison Interaction pointe surface Mesure sans contact Microscopie force atomique Microscopie tunnel balayage Nanoparticule Nitrure de bore Rhodium Sonde Kelvin Spectre photoélectron Structure surface Surstructure Travail sortie BN

Keyword (en)

Image contrast Elastic deformation Binding energy Tip surface interactions Non contact measurement Atomic force microscopy Scanning tunneling microscopy Nanoparticles Boron nitride Rhodium Kelvin probe Photoelectron spectra Surface structure Superstructure Work functions

Keyword (es)

Imagen contraste Medida sin contacto Boro nitruro Sonda Kelvin Superestructura

Classification

Pascal: 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A46 Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals

Discipline

Physics of condensed state : structure, mechanical and thermal properties

Origin

Inist-CNRS

Database: PASCAL
INIST identifier: 26208618

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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Contrast inversion of the h-BN nanomesh investigated by nc-AFM and Kelvin probe force microscopy

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