Multilayer and thin film analysis using FPMulti software
- Author
- BEKKERS, M. H. J1 ; VAN SPRANG, H. A1
[1] Philips Research Laboratories, P.O. Box 80000, 5656 AA Eindhoven, Netherlands - Conference title
- Durham Conference on X-Ray Analysis
- Conference name
- Durham Conference on X-Ray Analysis (Durham 1995-09-18)
- Author (monograph)
- HURLEY, Pat (Editor)1
[1] Philips Analytical X-Ray, 7602 EA Almelo, Netherlands - Source
X-ray spectrometry. 1997, Vol 26, Num 3, pp 122-124 ; ref : 7 ref
- CODEN
- XRSPAX
- ISSN
- 0049-8246
- Scientific domain
- Analytical chemistry; Physics
- Publisher
- Wiley, Chichester
- Publication country
- United Kingdom
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Analyse surface Composition chimique Couche mince Logiciel Multicouche Performance Spectrométrie RX Traitement donnée Analyse semiquantitative
- Keyword (en)
- Surface analysis Chemical composition Thin films Software Multilayers Performance X-ray spectroscopy Data processing
- Keyword (es)
- Logicial
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G05 Computers in experimental physics / 001B00G05K Data analysis: algorithms and implementation; data management
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04C Spectrometric and optical methods
- Discipline
- Analytical chemistry Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2708747
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/(SICI)1097-4539(199705)26:3<122::AID-XRS220>3.0.CO;2-V 
https://dx.doi.org/10.1002/(SICI)1097-4539(199705)26:3<122::AID-XRS220>3.0.CO;2-V
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