Effect of stacking type in precursors on composition, morphology and electrical properties of the CIGS films
- Author
- JUN LIU1 ; AI XIANG WEI1 ; YU ZHAO1 ; ZHI QIANG YAN1
[1] School of Material and Energy, Guangdong University of Technology, Guangzhou 510006, China - Source
Journal of materials science. Materials in electronics. 2013, Vol 24, Num 7, pp 2553-2557, 5 p ; ref : 23 ref
- ISSN
- 0957-4522
- Scientific domain
- Electronics; Condensed state physics
- Publisher
- Springer, Norwell, MA
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Addition sélénium Caractéristique électrique Conductivité électrique Couche mince Cuivre Densité trou Diffraction RX Dispersion énergie Effet Hall Empilement Gallium Indium Matériau dopé Microscopie électronique balayage Microstructure Mobilité trou Morphologie Poudre Propriété électrique Pulvérisation cathodique Semiconducteur type p Spectrométrie dispersive Verre 0779 6865 7363 8105K
- Keyword (en)
- Selenium addition Electrical characteristic Electrical conductivity Thin film Copper Hole density X ray diffraction Energy dispersion Hall effect Stacking Gallium Indium Doped materials Scanning electron microscopy Microstructure Hole mobility Morphology Powder Electrical properties Cathodic sputtering p type semiconductor Dispersive spectrometry Glass
- Keyword (es)
- Adición selenio Característica eléctrica Conductividad eléctrica Capa fina Cobre Densidad huecos Difracción RX Dispersión energía Efecto Hall Apilamiento Galio Indio Microscopía electrónica barrido Microestructura Movilidad agujero Morfología Polvo Propiedad eléctrica Pulverización catódica Semiconductor tipo p Espectrometría dispersiva Vidrio
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H65 Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A05 Specific materials / 001B80A05K Glasses (including metallic glasses)
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15C Deposition by sputtering
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03C Materials
- Discipline
- Electronics Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 27566721
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/s10854-013-1132-3 
https://dx.doi.org/10.1007/s10854-013-1132-3
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