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Nanoindentation Response of Poly(ether ether ketone) Surfaces—A Semicrystalline Bimodal Behavior

Author
IQBAL, Tanveer1 ; BRISCOE, Brian J2 ; YASIN, Saima2 ; LUCKHAM, Paul F2
[1] Chemical Engineering Department, University of Engineering & Technology, KSK Campus, Lahore, Pakistan
[2] Chemical Engineering Department, Imperial College, South Kensington, London SW7 2AZ, United Kingdom
Source

Journal of applied polymer science (Print). 2013, Vol 130, Num 6, pp 4401-4409, 9 p ; ref : 30 ref

CODEN
JAPNAB
ISSN
0021-8995
Scientific domain
Polymers, paint and wood industries
Publisher
Wiley, Hoboken, NJ
Publication country
United States
Document type
Article
Language
English
Author keyword
coatings mechanical properties properties and characterization surfaces and interfaces
Keyword (fr)
Cristallinité Dureté Etherethercétone polymère Etude expérimentale Matériau revêtement Module élasticité Méthode mesure Méthode non destructive Nanoindentation Polymère semicristallin Propriété mécanique
Keyword (en)
Crystallinity Hardness Polyetheretherketone Experimental study Coating material Elastic modulus Measurement method Non destructive method Nanoindentation Semicrystalline polymer Mechanical properties
Keyword (es)
Cristalinidad Dureza Eter éter cetona polímero Estudio experimental Material revestimiento Módulo elasticidad Método medida Método no destructivo Nanoindentacion Polímero semicristalino Propiedad mecánica
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D09 Physicochemistry of polymers / 001D09B Polymers and radiations / 001D09B04 Properties and characterization

Discipline
Physical chemistry of polymers
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
27761891

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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