Surface resistance and morphology of YBCO films as a function of thickness
- Author
- STORK, F. J. B1 ; BEALL, J. A1 ; ROSHKO, A1 ; DEGROOT, D. C1 ; RUDMAN, D. A1 ; ONO, R. H1 ; KRUPKA, J2
[1] NIST, Boulder, CO 80303, United States
[2] Warsaw University of Technology, Warsaw, Poland - Conference title
- Materials
- Conference name
- 1996 Applied Superconductivity Conference. Part II (Pittsburgh, PA 1996-08-25)
- Author (monograph)
- Applied Superconductivity Conference Inc, United States (Funder/Sponsor)
- Source
IEEE transactions on applied superconductivity. 1997, Vol 7, Num 2, pp 1921-1924 ; 2 ; ref : 15 ref
- ISSN
- 1051-8223
- Scientific domain
- Electronics; Electrical engineering
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F11 Superconducting devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02B Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2802869
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/77.620961 
https://dx.doi.org/10.1109/77.620961
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