Contribution of thickness dependent void fraction and TiSixOy interlayer to the optical properties of amorphous TiO2 thin films
- Author
- FAN ZHANG1 ; ZHANG, Rong-Jun1 ; ZHENG, Yu-Xiang1 ; XU, Zi-Jie1 ; ZHANG, Dong-Xu1 ; WANG, Zi-Yi1 ; XIANG YU1 ; CHEN, Liang-Yao1
[1] Key Laboratory of Micro and Nano Photonic Structures, Ministry of Education, China Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, Department of Optical Science and Engineering, Fudan University, Shanghai 200433, China - Source
Thin solid films. 2013, Vol 548, pp 275-279, 5 p ; ref : 30 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Electron beam evaporation Optical properties Spectroscopic ellipsometry TiO2 films
- Keyword (fr)
- Bande interdite photonique Capacité électrique Cavité dans réseau Couche intermédiaire Couche mince amorphe Couche mince Défaut cristallin Effet dimensionnel Ellipsométrie spectroscopique Epaisseur couche Evaporation faisceau électronique Modèle milieu effectif Propriété optique 0760F 6172Q 7866 8115K TiSixOy
- Keyword (en)
- Photonic band gap Capacitance Voids Interlayers Amorphous thin film Thin films Crystal defects Size effect Spectroscopic ellipsometry Layer thickness Electron beam evaporation Effective medium model Optical properties
- Keyword (es)
- Capa fina amorfa Elipsometría espectroscópica Espesor capa Modelo medio efectivo
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60F Polarimeters and ellipsometers
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72Q Microscopic defects (voids, inclusions, etc.)
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15K Vapor phase epitaxy; growth from vapor phase
- Discipline
- Metrology Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 28250139
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2013.10.038 
https://dx.doi.org/10.1016/j.tsf.2013.10.038
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