Electrochemical impedance spectroscopy of oxidized porous silicon
- Author
- MULA, Guido1 ; TIDDIA, Maria V1 ; RUFFILLI, Roberta2 ; FALQUI, Andrea2 3 ; PALMAS, Simonetta4 ; MASCIA, Michele4
[1] Dipartimento di Fisica, Università degli Studi di Cagliari, Cittadella Universitaria di Monserrato, S.P. 8 km 0.700, 09042 Cagliari, Italy
[2] Nanochemistry, Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy
[3] Dipartimento di Scienze Chimiche e Geologiche, Università degli Studi di Cagliari, Cittadella Universitaria di Monserrato, S.P. 8 km 0.700, 09042 Cagliari, Italy
[4] Dipartimento di Ingegneria Meccanica Chimica e dei Materiali, Università degli Studi di Cagliari, Piazza d'Armi, 09126 Cagliari, Italy - Source
Thin solid films. 2014, Vol 556, pp 311-316, 6 p ; ref : 44 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Electrochemical oxidation Energy dispersive spectroscopy Galvanostatic electrochemical impedance spectroscopy Optical reflectivity Porous silicon Refractive index Scanning electron microscopy
- Keyword (fr)
- Densité courant Epaisseur couche Facteur réflexion Indice réfraction Microscopie électronique balayage Oxydation Propriété optique Schéma équivalent Semiconducteur poreux Spectrométrie dispersive Spectroscopie impédance électrochimique 6855J 7866 7867
- Keyword (en)
- Current density Layer thickness Reflectivity Refractive index Scanning electron microscopy Oxidation Optical properties Equivalent circuits Porous semiconductors Dispersive spectrometry Electrochemical impedance spectroscopy
- Keyword (es)
- Espesor capa Espectrometría dispersiva Espectrometría impedancia electroquímica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H67 Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 28331851
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2014.01.044 
https://dx.doi.org/10.1016/j.tsf.2014.01.044
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