Characterization of Langmuir and Langmuir―Blodgett films of an octasubstituted zinc phthalocyanine
- Author
- TORRENT-BURGUES, J1 4 ; CEA, P2 3 ; GINER, I2 ; GUAUS, E1
[1] Department of Chemical Engineering, Universitat Politècnica de Catalunya (UPC), C/Colom 1, 08222 Terrassa, Barcelona, Spain
[2] Departamento de Química Orgánica y Quimica Física, Facultad de Ciencias, Universidad de Zaragoza, 50009 Zaragoza, Spain
[3] Instituto de Nanociencia de Aragón (INA) y Laboratorio de Microscopias Avanzadas (LMA), Edificio i+d, Campus Rio Ebro, Universidad de Zaragoza, C/Mariano Esquillor, s/n, 50017 Zaragoza, Spain
[4] Institut de Bioenginyeria de Catalunya (IBEC), 08028 Barcelona, Spain - Source
Thin solid films. 2014, Vol 556, pp 485-494, 10 p ; ref : 44 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Atomic Force Microscopy Electrochemistry Langmuir-Blodgett Multilayers Optical spectroscopy techniques Zinc phthalocyanine
- Keyword (fr)
- Couche Langmuir Blodgett Couche Langmuir Couche mince Couche multimoléculaire Distribution aléatoire Effet pression Electrochimie Interface gaz liquide Microscopie force atomique Multicouche Phtalocyanine Potentiel surface Propriété électrochimique Spectre IR Spectre UV visible Spectre absorption Spectre réflexion Transition phase Voltammétrie cyclique Zinc 6837P 6855J 7840R 8115L
- Keyword (en)
- Langmuir-Blodgett films Langmuir layer Thin films Multilayer Random distribution Pressure effects Electrochemistry Gas liquid interface Atomic force microscopy Multilayers Phthalocyanines Surface potential Electrochemical properties Infrared spectra Ultraviolet visible spectrum Absorption spectra Reflection spectrum Phase transitions Cyclic voltammetry Zinc
- Keyword (es)
- Capa Langmuir Capa multimolecular Distribución aleatoria Interfase gas líquido Propiedad electroquímica Espectro UV visible Espectro reflexión Transición fase Voltametría cíclica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy / 001B60A16C Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H40 Visible and ultraviolet spectra / 001B70H40R Fullerenes and related materials
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15L Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids)
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 28331879
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2014.01.045 
https://dx.doi.org/10.1016/j.tsf.2014.01.045
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