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Temperature-dependent electrical transport properties of (Au/Ni)/n-GaN Schottky barrier diodes

Author
DOGAN, Hulya1 ; ELAGOZ, Sezai2 3
[1] Department of Electrical-Electronics Engineering, Cumhuriyet University, Sivas 58140, Turkey
[2] Department of Nanotechnology Engineering, Cumhuriyet University, Sivas 58140, Turkey
[3] Nanotechnology Research Center, Cumhuriyet University, Sivas 58140, Turkey
Source

Physica. E, low-dimentional systems and nanostructures. 2014, Vol 63, pp 186-192, 7 p ; ref : 44 ref

ISSN
1386-9477
Scientific domain
Crystallography; Electronics; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
Barrier inhomogeneities Current transport mechanism Schottky barrier height Series resistance
Keyword (fr)
Barrière Schottky Caractéristique électrique Composé III-V Diode barrière Schottky Dépendance température Hauteur barrière Interface Loi normale Propriété transport Propriété électrique Semiconducteur III-V 8530H GaN
Keyword (en)
Schottky barrier Electrical characteristic III-V compound Schottky barrier diode Temperature dependence Barrier height Interface Gaussian distribution Transport properties Electrical properties III-V semiconductors
Keyword (es)
Barrera Schottky Característica eléctrica Compuesto III-V Diodo barrera Schottky Altura barrera Interfase Curva Gauss Propiedad transporte Propiedad eléctrica
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F01 Interfaces

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
28700955

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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