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Momentum dependent energy loss near edge structures using a CTEM: the reliability of the methods available

Author
BOTTON, G. A; BOOTHROYD, C. B; STOBBS, W. M
Univ. Cambirdge, dep. materials sci. metallurgy, Cambridge CB2 3QZ, United Kingdom
Conference title
Electron energy loss spectroscopy and imaging. I: Techniques. II: Instrumentation
Conference name
EELSI 94 : international workshop on electron energy loss spectroscopy and imaging (2 ; Leukerbad 1994-07-24)
Author (monograph)
KRIVANEK, Ondrej L (Editor)1
[1] Gatan R&D, Pleasanton CA, United States
Source

Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 93-107 ; ref : 18 ref

CODEN
ULTRD6
ISSN
0304-3991
Scientific domain
Cell biology, histology; Crystallography; Physics
Publisher
Elsevier Science, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Keyword (fr)
Baryum oxyde Composé quaternaire Cuivre oxyde Etude expérimentale Microscopie électronique Seuil énergie Spectrométrie perte énergie électron Spectrométrie électronique Supraconducteur haute température TEM Yttrium oxyde 0781 Ba Cu O Y Près du seuil YBa2Cu3O7-δ Composé minéral
Keyword (en)
Barium oxides Quaternary compounds Copper oxides Experimental study Electron microscopy Threshold energy EEL spectroscopy Electron spectroscopy High-Tc superconductors TEM Yttrium oxides Inorganic compounds
Keyword (es)
Umbral energía
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G81 Electron, ion spectrometers and related techniques

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3676667

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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