Structural transformation of the (233)[001], Σ=11 tilt grain boundary in silicon
- Author
- KIRCHNER, H. O. K1 ; THIBAULT, J2 ; PUTAUX, J. L2
[1] Univ. Paris-Sud, inst. sci. matériaux, 91405 Orsay, France
[2] CEA CEN Grenoble, dép. rech. fondamentale matière condensée, SP2M/S, 38041 Grenoble, France - Source
Philosophical magazine letters. 1994, Vol 69, Num 4, pp 185-188 ; ref : 10 ref
- CODEN
- PMLEEG
- ISSN
- 0950-0839
- Scientific domain
- Crystallography; Condensed state physics
- Publisher
- Taylor & Francis, London
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Dépendance température Energie libre Entropie Etude expérimentale Joint grain Matériau semiconducteur Propriété thermodynamique Silicium Structure défaut Si Non métal
- Keyword (en)
- Temperature dependence Free energy Entropy Experimental study Grain boundaries Semiconductor materials Thermodynamic properties Silicon Defect structure Nonmetals
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72M Grain and twin boundaries
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60E Thermal properties of condensed matter / 001B60E40 Thermal properties of crystalline solids / 001B60E40G Thermodynamic properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4238637
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1080/09500839408241590 
https://dx.doi.org/10.1080/09500839408241590
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